Tonomura A
Advanced Research Laboratory, Hitachi, Ltd., Saitama, Japan.
J Electron Microsc (Tokyo). 1995 Dec;44(6):425-35.
This paper reports on the recent remarkable progress made in electron phase microscopy, especially due to the development of both a "coherent" field-emission electron beam and the related image processing techniques. With these techniques, the phase distribution of an electron beam transmitted through a specimen can now be measured with a precision of within 1/100 of the electron wavelength to observe the thickness distribution of a uniform specimen at the atomic level, the magnetic domain structures in a ferromagnetic thin film, and individual vortices in a superconducting thin film. Vortices in superconducting thin films have become dynamically observable by Lorentz microscopy.
本文报道了电子相显微镜最近取得的显著进展，这尤其得益于“相干”场发射电子束和相关图像处理技术的发展。借助这些技术，现在可以以电子波长的1/100以内的精度测量透过样品的电子束的相位分布，从而在原子水平上观察均匀样品的厚度分布、铁磁薄膜中的磁畴结构以及超导薄膜中的单个涡旋。通过洛伦兹显微镜，超导薄膜中的涡旋已变得可动态观测。
