Leslie A G
MRC Laboratory of Molecular Biology, Hills Road, Cambridge CB2 2QH, England.
Acta Crystallogr D Biol Crystallogr. 1999 Oct;55(Pt 10):1696-702. doi: 10.1107/s090744499900846x.
Diffraction intensities can be evaluated by two distinct procedures: summation integration and profile fitting. Equations are derived for evaluating the intensities and their standard errors for both cases, based on Poisson statistics. These equations highlight the importance of the contribution of the X-ray background to the standard error and give an estimate of the improvement which can be achieved by profile fitting. Profile fitting offers additional advantages in allowing estimation of saturated reflections and in dealing with incompletely resolved diffraction spots.
求和积分法和轮廓拟合法。基于泊松统计,推导了两种情况下评估强度及其标准误差的方程。这些方程突出了X射线背景对标准误差贡献的重要性,并给出了通过轮廓拟合可实现的改进估计。轮廓拟合在允许估计饱和反射以及处理未完全分辨的衍射斑点方面具有额外的优势。