Juska G, Arlauskas K, Viliunas M, Kocka J
Department of Solid State Electronics, Vilnius University, Sauletekio 9, III K, 2040 Vilnius, Lithuania.
Phys Rev Lett. 2000 May 22;84(21):4946-9. doi: 10.1103/PhysRevLett.84.4946.
The transport properties of microcrystalline silicon, namely, mobility and conductivity, are investigated by a new method, for which the simple theory as well as numerical modeling is presented. The basic idea of the new method is verified on amorphous hydrogenated silicon by comparison with the widely used time-of-flight method. Contrary to time of flight, the new method can be used even for relatively conductive materials. Preliminary results on microcrystalline silicon clearly indicate the critical role of amorphouslike tissue in transport in microcrystalline silicon.
通过一种新方法研究了微晶硅的输运特性，即迁移率和电导率，并给出了该方法的简单理论以及数值模型。通过与广泛使用的飞行时间法进行比较，验证了新方法在非晶氢化硅上的基本思想。与飞行时间法不同，新方法甚至可用于相对导电的材料。关于微晶硅的初步结果清楚地表明了类非晶组织在微晶硅输运中的关键作用。
