Bachtold A, Fuhrer M S, Plyasunov S, Forero M, Anderson E H, Zettl A, McEuen P L
Department of Physics, University of California, Berkeley, California 94720, USA.
Phys Rev Lett. 2000 Jun 26;84(26 Pt 1):6082-5. doi: 10.1103/PhysRevLett.84.6082.
We use electrostatic force microscopy and scanned gate microscopy to probe the conducting properties of carbon nanotubes at room temperature. Multiwalled carbon nanotubes are shown to be diffusive conductors, while metallic single-walled carbon nanotubes are ballistic conductors over micron lengths. Semiconducting single-walled carbon nanotubes are shown to have a series of large barriers to conduction along their length. These measurements are also used to probe the contact resistance and locate breaks in carbon nanotube circuits.
我们使用静电力显微镜和扫描门显微镜在室温下探测碳纳米管的导电特性。结果表明，多壁碳纳米管是扩散导体，而金属性单壁碳纳米管在微米长度范围内是弹道导体。半导体性单壁碳纳米管沿其长度方向存在一系列较大的导电势垒。这些测量还用于探测碳纳米管电路中的接触电阻并定位断点。
