Swift J A, Smith J R
Department of Fetal and Infant Toxico-Pathology, University of Liverpool, UK.
Scanning. 2000 Sep-Oct;22(5):310-8. doi: 10.1002/sca.4950220506.
The atomic force microscope (AFM) was used to investigate the surface architecture of the entire lengths of cleaned human head hairs. Many features previously seen with the scanning electron microscope (SEM) were identified. However, the AFM has provided much greater detail and, in particular, the hair's cuticular surfaces appear not to be as smooth as had been previously supposed. A consistent feature was of step discontinuities or "ghosts" on the scale surfaces. These delineated the original location of each overlying scale before its edge had been chipped away. There was a change in the longitudinal angular presentation of the surfaces about each ghost. This means the distal ends of each cuticle cell have been synthesised in the follicle to be thicker than where that same cuticle cell is bounded on both sides by other cuticle cells. The undamaged outer cuticular surfaces at the root end of each hair were covered everywhere by longitudinal ridges (striations). Where the hair surface was worn, the striations terminated at a scale edge ghost. The ridges were approximately 9 nm high and were in parallel array with a lateral repeat spacing of about 350 nm. The striations are evidently formed on the outer surface of each cuticle cell following earlier contact in the hair follicle with the inner root sheath. The study of stained transverse sections of hairs in the transmission electron microscope (TEM) is suggested as a means for throwing some light on the underlying structure and chemistry of the striations. Finally, our AFM studies have revealed that the surface of the freshly emergent hair gradually changes over a distance of about 20 mm and that the surface of the hair for most of its length is quite different from that near the root. This is likely to be of import to those engaged in the hair toiletries industry.
原子力显微镜(AFM)被用于研究清洁后的人类头发全长的表面结构。识别出了许多先前在扫描电子显微镜(SEM)下看到的特征。然而,AFM提供了更多细节,特别是头发的角质表面似乎不像之前认为的那么光滑。一个一致的特征是在鳞片表面存在阶梯状不连续性或“幽灵”。这些划定了每个覆盖鳞片在其边缘被磨损之前的原始位置。每个“幽灵”周围表面的纵向角度呈现都有变化。这意味着每个角质细胞的远端在毛囊中合成时比该角质细胞两侧被其他角质细胞包围的地方更厚。每根头发根部未受损的外角质表面到处都覆盖着纵向脊(条纹)。在头发表面磨损的地方,条纹终止于鳞片边缘“幽灵”处。这些脊大约高9纳米,呈平行排列,横向重复间距约为350纳米。这些条纹显然是在每个角质细胞的外表面形成的,这是由于毛囊中早期与内根鞘接触所致。建议通过透射电子显微镜(TEM)对染色后的头发横切片进行研究,以揭示条纹的潜在结构和化学性质。最后,我们的AFM研究表明,新长出的头发表面在大约20毫米的距离内逐渐变化,并且头发大部分长度的表面与根部附近的表面有很大不同。这可能对从事头发护理产品行业的人很重要。