Tay F R, Sano H, Carvalho R, Pashley E L, Pashley D H
Department of Conservative Dentistry, Faculty of Dentistry, University of Hong Kong, Hong Kong, China.
J Adhes Dent. 2000 Summer;2(2):83-98.
The objectives of this study were (1) to determine the depth of demineralization into intact dentin using several self-etching primer systems with different pH values, and (2) to evaluate whether hybridization of intact dentin in Clearfil SE Bond may be affected by variation in the thickness of the smear layers.
Dentin disks were created from mid-coronal dentin in extracted, human third molars. Three self-etching primer systems (Clearfil Liner Bond II, Liner Bond 2V, and SE Bond) were applied separately to these disks to evaluate how deep self-etching systems penetrate through smear layers into intact dentin. Dentin treated with All-Bond 2 using the "no-etch" technique was used as a control group. In the second part of the study, dentin disks with different smear-layer thicknesses were produced. The cryofractured control group was devoid of a smear layer. The experimental teeth were ground with 60-, 180-, or 600-grit SiC paper and bonded using SE Bond. Dentin disks were bonded together and examined with TEM.
All-Bond 2 did not etch beyond the smear layer. The three self-etching primers etched beyond the smear layer to form true hybrid layers within intact dentin. This layer was thickest with Liner Bond 2 (ca 1.2 to 1.4 microns), but very thin (0.5 micron) using both Liner Bond 2V and SE Bond. Application of SE Bond to dentin of different surface roughness produced hybridized smear layers of variable thickness. However, the thickness of the underlying true hybrid remained consistent for the four groups (ca 0.4 to 0.5 micron).
Self-etching primers create thin hybrid layers that incorporate the smear layer. The suspicion that thick smear layers may interfere with the diffusion of self-etching primers into the underlying intact dentin was not confirmed.
本研究的目的是：（1）使用几种不同pH值的自酸蚀底漆系统，确定脱矿进入完整牙本质的深度；（2）评估Clearfil SE Bond中完整牙本质的杂交是否会受到玷污层厚度变化的影响。
从拔除的人类第三磨牙的牙冠中部牙本质制作牙本质盘。将三种自酸蚀底漆系统（Clearfil Liner Bond II、Liner Bond 2V和SE Bond）分别应用于这些牙本质盘，以评估自酸蚀系统透过玷污层进入完整牙本质的深度。使用“无酸蚀”技术用All - Bond 2处理的牙本质用作对照组。在研究的第二部分，制作具有不同玷污层厚度的牙本质盘。冷冻断裂的对照组没有玷污层。实验牙齿用60目、180目或600目的碳化硅砂纸打磨，并用SE Bond粘结。将牙本质盘粘结在一起，用透射电子显微镜检查。
All - Bond 2没有酸蚀超过玷污层。三种自酸蚀底漆蚀刻超过玷污层，在完整牙本质内形成真正的混合层。该层在Liner Bond 2中最厚（约1.2至1.4微米），但使用Liner Bond 2V和SE Bond时非常薄（0.5微米）。将SE Bond应用于不同表面粗糙度的牙本质产生了厚度可变的杂交玷污层。然而，四组中下层真正混合层的厚度保持一致（约0.4至0.5微米）。
自酸蚀底漆形成包含玷污层的薄混合层。厚玷污层可能会干扰自酸蚀底漆扩散到下方完整牙本质的怀疑未得到证实。
