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二维和薄三维蛋白质晶体的零损失与传统电子衍射的定量比较。

Quantitative comparison of zero-loss and conventional electron diffraction from two-dimensional and thin three-dimensional protein crystals.

作者信息

Yonekura Koji, Maki-Yonekura Saori, Namba Keiichi

机构信息

Protonic NanoMachine Project, ERATO, JST, 3-4 Hikaridai, Seika 619-0237, Japan.

出版信息

Biophys J. 2002 May;82(5):2784-97. doi: 10.1016/S0006-3495(02)75619-1.

Abstract

The scattering cross-section of atoms in biological macromolecules for both elastically and inelastically scattered electrons is approximately 100,000 times larger than that for x-ray. Therefore, much smaller (<1 microm) and thinner (<0.01 microm) protein crystals than those used for x-ray crystallography can be used to analyze the molecular structures by electron crystallography. But, inelastic scattering is a serious problem. We examined electron diffraction data from thin three-dimensional (3-D) crystals (600-750 A thick) and two-dimensional (2-D) crystals (approximately 60 A thick), both at 93 K, with an energy filtering electron microscope operated at an accelerating voltage of 200 kV. Removal of inelastically scattered electrons significantly improved intensity data statistics and R(Friedel) factor in every resolution range up to 3-A resolution. The effect of energy filtering was more prominent for thicker crystals but was significant even for thin crystals. These filtered data sets showed better intensity statistics even in comparison with data sets collected at 4 K and an accelerating voltage of 300 kV without energy filtering. Thus, the energy filter will be an effective and important tool in the structure analysis of thin 3-D and 2-D crystals, particularly when data are collected at high tilt angle.

摘要

生物大分子中原子对弹性和非弹性散射电子的散射截面大约比X射线的散射截面大100,000倍。因此,与用于X射线晶体学的蛋白质晶体相比,尺寸小得多(<1微米)且厚度薄得多(<0.01微米)的蛋白质晶体可用于通过电子晶体学分析分子结构。但是,非弹性散射是一个严重的问题。我们使用加速电压为200 kV的能量过滤电子显微镜,在93 K下检查了来自薄三维(3-D)晶体(600 - 750 Å厚)和二维(2-D)晶体(约60 Å厚)的电子衍射数据。去除非弹性散射电子显著改善了直至3 Å分辨率的每个分辨率范围内的强度数据统计和R(弗里德尔)因子。能量过滤对较厚晶体的影响更为显著,但对薄晶体也很明显。即使与在4 K和300 kV加速电压下未进行能量过滤收集的数据集相比,这些过滤后的数据集也显示出更好的强度统计。因此,能量过滤器将成为薄三维和二维晶体结构分析中的一种有效且重要的工具,特别是在高倾斜角度收集数据时。

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