Fan Fu-Ren F, Yang Jiping, Cai Lintao, Price David W, Dirk Shawn M, Kosynkin Dmitry V, Yao Yuxing, Rawlett Adam M, Tour James M, Bard Allen J
Department of Chemistry and Biochemistry and Center for Nano-and Molecular Science and Technology, The University of Texas at Austin, 78712, USA.
J Am Chem Soc. 2002 May 15;124(19):5550-60. doi: 10.1021/ja017706t.
The electrical properties of self-assembled monolayers (SAMs) on metal surfaces have been explored for a series of molecules to address the relation between the behavior of a molecule and its structure. We probed interfacial electron transfer processes, particularly those involving unoccupied states, of SAMs of thiolates or arylates on Au by using shear force-based scanning probe microscopy (SPM) combined with current-voltage (i-V) and current-distance (i-d) measurements. The i-V curves of hexadecanethiol in the low bias regime were symmetric around 0 V and the current increased exponentially with V at high bias voltage. Different than hexadecanethiol, reversible peak-shaped i-V characteristics were obtained for most of the nitro-based oligo(phenylene ethynylene) SAMs studied here, indicating that part of the conduction mechanism of these junctions involved resonance tunneling. These reversible peaked i-V curves, often described as a negative differential resistance (NDR) effect of the junction, can be used to define a threshold tip bias, V(TH), for resonant conduction. We also found that for all of the SAMs studied here, the current decreased with increasing distance, d, between tip and substrate. The attenuation factor beta of hexadecanethiol was high, ranging from 1.3 to 1.4 A(-1), and was nearly independent of the tip bias. The beta-values for nitro-based molecules were low and depended strongly on the tip bias, ranging from 0.15 A(-1) for tetranitro oligo(phenylene ethynylene) thiol, VII, to 0.50 A(-1) for dinitro oligo(phenylene) thiol, VI, at a -3.0 V tip bias. Both the V(TH) and beta values of these nitro-based SAMs were also strongly dependent on the structures of the molecules, e.g. the number of electroactive substituent groups on the central benzene, the molecular wire backbone, the anchoring linkage, and the headgroup. We also observed charge storage on nitro-based molecules. For a SAM of the dintro compound, V, approximately 25% of charge collected in the negative scan is stored in the molecules and can be collected at positive voltages. A possible mechanism involving lateral electron hopping is proposed to explain this phenomenon.
为了研究分子行为与其结构之间的关系,人们对一系列分子在金属表面自组装单分子层(SAMs)的电学性质进行了探索。我们通过基于剪切力的扫描探针显微镜(SPM)结合电流-电压(i-V)和电流-距离(i-d)测量,探究了金表面硫醇盐或芳基化物自组装单分子层的界面电子转移过程,特别是那些涉及未占据态的过程。十六烷硫醇在低偏压区域的i-V曲线在0 V左右对称,在高偏压下电流随电压呈指数增加。与十六烷硫醇不同,在此研究的大多数基于硝基的低聚(亚苯基乙炔)自组装单分子层获得了可逆的峰形i-V特性,这表明这些结的部分传导机制涉及共振隧穿。这些可逆的峰形i-V曲线,通常被描述为结的负微分电阻(NDR)效应,可用于定义共振传导的阈值尖端偏压V(TH)。我们还发现,对于在此研究的所有自组装单分子层,电流随着尖端与基底之间距离d的增加而减小。十六烷硫醇的衰减因子β很高,范围从1.3到1.4 Å⁻¹,并且几乎与尖端偏压无关。基于硝基的分子的β值较低,并且强烈依赖于尖端偏压,在-3.0 V尖端偏压下,从四硝基低聚(亚苯基乙炔)硫醇VII的0.15 Å⁻¹到二硝基低聚(亚苯基)硫醇VI的0.50 Å⁻¹不等。这些基于硝基的自组装单分子层的V(TH)和β值也强烈依赖于分子结构,例如中心苯上的电活性取代基的数量、分子线骨架、锚定连接和头基。我们还观察到基于硝基的分子上的电荷存储。对于二硝基化合物V的自组装单分子层,在负扫描中收集的大约25%的电荷存储在分子中,并且可以在正电压下收集。提出了一种涉及横向电子跳跃的可能机制来解释这种现象。