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一种用于随机关联处理的利用热噪声辅助隧穿的多纳米点电路及结构。

A multi-nano-dot circuit and structure using thermal-noise-assisted tunneling for stochastic associative processing.

作者信息

Morie Takashi, Matsuura Tomohiro, Nagata Makoto, Iwata Atsushi

机构信息

Graduate School of Advanced Sciences of Matter, Hiroshima University, Higashi-Hiroshima, Japan.

出版信息

J Nanosci Nanotechnol. 2002 Jun-Aug;2(3-4):343-9. doi: 10.1166/jnn.2002.100.

Abstract

The single-electron circuit and nanostructure described in this paper are designed for stochastic associative processing, which is an expanded version of ordinary associative memory processing. In stochastic associative processing, the association probability of each stored pattern depends on the similarity between the stored pattern and the input pattern. Such unique processing is useful for sequential stochastic association and for clustering for vector quantization. Conventional single-electron circuits operate only at very low temperature for practical junction capacitance (i.e., 30 K for 0.1 aF) because the charging energy in these circuits is directly related to the tunnel junction capacitance. Our multi-nano-dot circuit and structure operate at room temperature with a junction capacitance around 0.1 aF through tunneling processes assisted by thermal noise. We analyze the operation of this circuit in detail and propose for it a stochastic associative processing operation, where the detection timing of the electron position controls the association probability distribution.

摘要

本文所描述的单电子电路和纳米结构是为随机关联处理而设计的,它是普通关联记忆处理的扩展版本。在随机关联处理中,每个存储模式的关联概率取决于存储模式与输入模式之间的相似度。这种独特的处理方式对于顺序随机关联和向量量化的聚类很有用。传统的单电子电路仅在非常低的温度下才能实现实际的结电容(即0.1 aF时为30 K),因为这些电路中的充电能量与隧道结电容直接相关。我们的多纳米点电路和结构通过热噪声辅助的隧穿过程在室温下运行,结电容约为0.1 aF。我们详细分析了该电路的运行情况,并为其提出了一种随机关联处理操作,其中电子位置的检测时机控制着关联概率分布。

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