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纳米电子学问题:一条可能的路线图。

Issues of nanoelectronics: a possible roadmap.

作者信息

Wang Kang L

机构信息

Department of Electrical Engineering, University of California, Los Angeles, California 90095, USA.

出版信息

J Nanosci Nanotechnol. 2002 Jun-Aug;2(3-4):235-66. doi: 10.1166/jnn.2002.115.

Abstract

In this review, we will discuss a possible roadmap in scaling a nanoelectronic device from today's CMOS technology to the ultimate limit when the device fails. In other words, at the limit, CMOS will have a severe short channel effect, significant power dissipation in its quiescent (standby) state, and problems related to other essential characteristics. Efforts to use structures such as the double gate, vertical surround gate, and SOI to improve the gate control have continually been made. Other types of structures using SiGe source/drain, asymmetric Schottky source/drain, and the like will be investigated as viable structures to achieve ultimate CMOS. In reaching its scaling limit, tunneling will be an issue for CMOS. The tunneling current through the gate oxide and between the source and drain will limit the device operation. When tunneling becomes significant, circuits may incorporate tunneling devices with CMOS to further increase the functionality per device count. We will discuss both the top-down and bottom-up approaches in attaining the nanometer scale and eventually the atomic scale. Self-assembly is used as a bottom-up approach. The state of the art is reviewed, and the challenges of the multiple-step processing in using the self-assembly approach are outlined. Another facet of the scaling trend is to decrease the number of electrons in devices, ultimately leading to single electrons. If the size of a single-electron device is scaled in such a way that the Coulomb self-energy is higher than the thermal energy (at room temperature), a single-electron device will be able to operate at room temperature. In principle, the speed of the device will be fast as long as the capacitance of the load is also scaled accordingly. The single-electron device will have a small drive current, and thus the load capacitance, including those of interconnects and fanouts, must be small to achieve a reasonable speed. However, because the increase in the density (and/or functionality) of integrated circuits is the principal driver, the wiring or interconnects will increase and become the bottleneck for the design of future high-density and high-functionality circuits, particularly for single-electron devices. Furthermore, the massive interconnects needed in the architecture used today will result in an increase in load capacitance. Thus for single-electron device circuits, it is critical to have minimal interconnect loads. And new types of architectures with minimal numbers of global interconnects will be needed. Cellular automata, which need only nearest-neighbor interconnects, are discussed as a plausible example. Other architectures such as neural networks are also possible. Examples of signal processing using cellular automata are discussed. Quantum computing and information processing are based on quantum mechanical descriptions of individual particles correlated among each other. A quantum bit or qubit is described as a linear superposition of the wave functions of a two-state system, for example, the spin of a particle. With the interaction of two qubits, they are connected in a "wireless fashion" using wave functions via quantum mechanical interaction, referred to as entanglement. The interconnection by the nonlocality of wave functions affords a massive parallel nature for computing or so-called quantum parallelism. We will describe the potential and solid-state implementations of quantum computing and information, using electron spin and/or nuclear spin in Si and Ge. Group IV elements have a long coherent time and other advantages. The example of using SiGe for g factor engineering will be described.

摘要

在本综述中,我们将探讨把纳米电子器件从当今的CMOS技术扩展至器件失效时的极限状态的可能路线图。换句话说,在极限状态下,CMOS将出现严重的短沟道效应、其静态(待机)状态下显著的功耗以及与其他基本特性相关的问题。人们一直在努力采用诸如双栅极、垂直环绕栅极和绝缘体上硅(SOI)等结构来改善栅极控制。还将研究其他类型的结构,如使用SiGe源极/漏极、非对称肖特基源极/漏极等,作为实现终极CMOS的可行结构。在达到其缩放极限时,隧穿将成为CMOS面临的一个问题。通过栅极氧化物以及源极和漏极之间的隧穿电流将限制器件的运行。当隧穿变得显著时,电路可能会将隧穿器件与CMOS结合,以进一步提高每个器件的功能数量。我们将讨论在实现纳米尺度乃至最终原子尺度过程中的自上而下和自下而上的方法。自组装被用作一种自下而上的方法。回顾了当前的技术水平,并概述了使用自组装方法进行多步处理所面临的挑战。缩放趋势的另一个方面是减少器件中的电子数量,最终实现单电子器件。如果单电子器件的尺寸按使库仑自能高于热能(在室温下)的方式进行缩放,那么单电子器件将能够在室温下运行。原则上,只要负载电容也相应缩放,器件的速度就会很快。单电子器件的驱动电流较小,因此包括互连和扇出电容在内的负载电容必须很小才能实现合理的速度。然而,由于集成电路密度(和/或功能)的增加是主要驱动力,布线或互连将会增加,并成为未来高密度和高功能电路设计的瓶颈,特别是对于单电子器件而言。此外,当今使用的架构中所需的大量互连将导致负载电容增加。因此,对于单电子器件电路来说,使互连负载最小化至关重要。将需要具有最少全局互连数量的新型架构。仅需要最近邻互连的细胞自动机作为一个合理的例子进行了讨论。诸如神经网络等其他架构也是可能的。讨论了使用细胞自动机进行信号处理的示例。量子计算和信息处理基于相互关联的单个粒子的量子力学描述。量子比特或量子位被描述为二态系统波函数的线性叠加,例如粒子的自旋。通过两个量子位的相互作用,它们利用波函数通过量子力学相互作用以“无线方式”连接,这被称为纠缠。波函数的非定域性实现的互连为计算提供了大规模并行特性,即所谓的量子并行性。我们将描述量子计算和信息的潜力以及固态实现方式,使用硅和锗中的电子自旋和/或核自旋。IV族元素具有较长的相干时间和其他优点。将描述使用SiGe进行g因子工程的示例。

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