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多重疤痕,一种在尖顶酵母中发现的新型酵母疤痕。

MULTIPLE SCARS, A NEW TYPE OF YEAST SCAR IN APICULATE YEASTS.

作者信息

STREIBLOVA E, BERAN K, POKORNY V

出版信息

J Bacteriol. 1964 Oct;88(4):1104-11. doi: 10.1128/jb.88.4.1104-1111.1964.

DOI:10.1128/jb.88.4.1104-1111.1964
PMID:14219025
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC314860/
Abstract

Streiblová, Eva (Czechoslovak Academy of Sciences, Prague, Czechoslovakia), K. Beran, and V. Pokorný. Multiple scars, a new type of yeast scar in apiculate yeasts. J. Bacteriol. 88:1104-1111. 1964.-A new type of yeast scar is described in apiculate yeasts: Saccharomycodes, Nadsonia, Hanseniaspora, and Kloeckera. These scars are formed on the distal poles of the cell walls in the course of vegetative reproduction, and are the cause of the formation of the apiculate form of the cells. The structure of multiple scars was studied by fluorescence microscopy and by electron microscopy on carbon replicas and isolated cell walls. The discussion deals with the importance of described cytological structures for the morphogenesis of cells and for determining individual reproductive capacity of cells, and considers some questions related to the interpretation of the development of multiple scars.

摘要

斯特雷布洛娃,伊娃(捷克斯洛伐克科学院,布拉格,捷克斯洛伐克),K. 贝兰,以及V. 波科尔尼。多重疤痕,一种在尖顶酵母中发现的新型酵母疤痕。《细菌学杂志》88:1104 - 1111。1964年。——在尖顶酵母中描述了一种新型酵母疤痕:类酵母属、纳氏酵母属、汉逊酵母属和克勒克酵母属。这些疤痕在营养繁殖过程中形成于细胞壁的远端极点,并且是细胞形成尖顶形态的原因。通过荧光显微镜以及对碳复型和分离细胞壁进行电子显微镜观察,研究了多重疤痕的结构。讨论涉及所描述的细胞学结构对于细胞形态发生以及确定细胞个体繁殖能力的重要性,并考虑了一些与多重疤痕发育解释相关的问题。

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FACTORS PRODUCING HIGH YEAST YIELDS IN SYNTHETIC MEDIA.在合成培养基中产生高酵母产量的因素。
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ELECTRON MICROSCOPICAL STUDIES OF FROZEN-DRIED YEAST. IV. SCHIZOSACCHAROMYCES, NADSONIA AND SACCHAROMYCODES.冻干酵母的电子显微镜研究。IV. 裂殖酵母属、纳氏酵母属和类酵母属
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SYMPOSIUM ON BIOCHEMICAL BASES OF MORPHOGENESIS IN FUNGI. IV. MOLECULAR BASES OF FORM IN YEASTS.真菌形态发生的生化基础研讨会。IV. 酵母形态的分子基础。
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