Utsumi Wataru, Saitoh Hiroyuki, Kaneko Hiroshi, Watanuki Tetsu, Aoki Katsutoshi, Shimomura Osamu
Synchrotron Radiation Research Center, Japan Atomic Energy Research Institute, Mikazuki-cho, Sayo-gun, Hyogo 679-5148, Japan.
Nat Mater. 2003 Nov;2(11):735-8. doi: 10.1038/nmat1003. Epub 2003 Oct 26.
The synthesis of large single crystals of GaN (gallium nitride) is a matter of great importance in optoelectronic devices for blue-light-emitting diodes and lasers. Although high-quality bulk single crystals of GaN suitable for substrates are desired, the standard method of cooling its stoichiometric melt has been unsuccessful for GaN because it decomposes into Ga and N(2) at high temperatures before its melting point. Here we report that applying high pressure completely prevents the decomposition and allows the stoichiometric melting of GaN. At pressures above 6.0 GPa, congruent melting of GaN occurred at about 2,220 degrees C, and decreasing the temperature allowed the GaN melt to crystallize to the original structure, which was confirmed by in situ X-ray diffraction. Single crystals of GaN were formed by cooling the melt slowly under high pressures and were recovered at ambient conditions.
氮化镓(GaN)大单晶的合成对于蓝光发光二极管和激光器等光电器件而言至关重要。尽管需要适用于衬底的高质量块状GaN单晶,但通过冷却其化学计量熔体的标准方法对GaN并不成功,因为它在熔点之前的高温下会分解为Ga和N₂。在此我们报告,施加高压可完全防止分解并实现GaN的化学计量熔化。在高于6.0 GPa的压力下,GaN在约2220℃发生一致熔化,降低温度会使GaN熔体结晶为原始结构,这通过原位X射线衍射得到证实。通过在高压下缓慢冷却熔体形成了GaN单晶,并在环境条件下回收。