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Preparation of TEM foils from Nb-10 a/o Si.

作者信息

Cockeram B, Jackson A G, Omlor R E, Srinivasan R, Weiss I

机构信息

Department of Mechanical and Materials Engineering, Wright State University, Dayton, Ohio 45435.

出版信息

Microsc Res Tech. 1992 Aug 1;22(3):298-300. doi: 10.1002/jemt.1070220307.

DOI:10.1002/jemt.1070220307
PMID:1504356
Abstract

Ductile phase toughened composites contain phases with significantly different physical properties. Consequently, these phases thin at different rates depending on the sample preparation procedure. A new TEM foil preparation method for the ductile phase toughened Nb-10 a/o Si material has been developed. The method involves chemical thinning in a 70% nitric acid/30% hydrofluoric acid solution followed by electropolishing in a 12.5% sulfuric acid/87.5% methanol electrolyte at -40 degrees C. This procedure for making TEM foils results in large thin areas with the minimum of artifacts. Mechanical grinding of a sample followed by either ion milling, dimpling, or electropolishing produced foils with large electron transparent areas, but with uncharacteristic features of the original Nb-10 a/o Si alloy microstructure. These artifacts were identified as dislocations, surface mottling, and antiphase domains.

摘要

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