Beleggia M, Schofield M A, Volkov V V, Zhu Y
Brookhaven National Laboratory, Center for Functional Nanomaterials, Building 480, Upton, NY 11973, USA.
Ultramicroscopy. 2004 Dec;102(1):37-49. doi: 10.1016/j.ultramic.2004.08.004.
The Transport of Intensity technique is becoming a viable alternative to electron holography for phase retrieval in Transmission Electron Microscopy. However, several issues are still to be clarified in order to ascertain the applicability of the technique; among them, the controversy regarding its geometrical or wave-optical nature, as related to the phase detection limit. We show here that the Transport of Intensity is a wave-optical technique that works in a special regime of small defocus where the image intensity is linear with the defocus parameter. By a simple analytical example we show that the Transport of Intensity correctly reconstructs the electron optical phase shift even when the phase is smaller than pi, a value defining the boundary between the geometrical and wave approaches. Another example is given, the reconstruction of a phase jump, accompanied with experimental support showing that phase retrieval by Electron Holography and Transport of Intensity techniques yields results in good agreement.
在透射电子显微镜中,强度传输技术正成为电子全息术用于相位恢复的一种可行替代方法。然而,为了确定该技术的适用性,仍有几个问题有待阐明;其中包括与相位检测极限相关的关于其几何性质或波动光学性质的争议。我们在此表明,强度传输是一种波动光学技术,它在小散焦的特殊条件下起作用,此时图像强度与散焦参数呈线性关系。通过一个简单的解析示例,我们表明即使相位小于π(定义几何方法和波动方法之间边界的值),强度传输也能正确重建电子光学相移。还给出了另一个示例,即相位跃变的重建,并伴有实验支持,表明电子全息术和强度传输技术进行的相位恢复产生的结果吻合良好。