Sawant P D, Watson G S, Nicolau D, Myhra S, Nicolau D V
Swinburne University of Technology, P.O. Box 218, Hawthorn, Vic 3122, Australia.
J Nanosci Nanotechnol. 2005 Jun;5(6):951-7. doi: 10.1166/jnn.2005.125.
The atomic force microscopy has been used to analyze the immobilization of single stranded DNA on poly-L-lysine-coated glass and subsequent hybridization with complimentary DNA with the Z-threshold parameter and fractal analysis methods. The poly-L-lysine layer, which has a thickness of approximately 7 nm, presents nano-defects that could be critical for DNA immobilization by acting as a nucleation sites for ssDNA and subsequently for dsDNA aggregates. The Z-threshold for the dsDNA aggregates is much larger than for ssDNA, but the statistical fractal dimension is very similar, suggesting a conformal increase of the dimensions of the dsDNA aggregates mainly in the Z-direction, due to an effective ssDNA-ccDNA molecular recognition. This study demonstrates the use of fractal analysis in conjunction with the distribution of heights to evaluate the efficiency of DNA-DNA molecular recognition on surfaces and the impact of nanodefects.
原子力显微镜已被用于通过Z阈值参数和分形分析方法,分析单链DNA在聚-L-赖氨酸包被的玻璃上的固定化以及随后与互补DNA的杂交。厚度约为7纳米的聚-L-赖氨酸层存在纳米缺陷,这些缺陷可作为单链DNA以及随后双链DNA聚集体的成核位点,对DNA固定化至关重要。双链DNA聚集体的Z阈值远大于单链DNA,但统计分形维数非常相似,这表明由于有效的单链DNA-互补链DNA分子识别,双链DNA聚集体的尺寸主要在Z方向上呈共形增加。本研究展示了结合高度分布使用分形分析来评估表面上DNA-DNA分子识别的效率以及纳米缺陷的影响。