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In/Si(111) 界面中相互交织的电子和结构相变。

Intertwined electronic and structural phase transitions in the In/Si(111) interface.

作者信息

Guo Jiandong, Lee Geunseop, Plummer E W

机构信息

Department of Physics and Astronomy, The University of Tennessee, Knoxville, 37996, USA.

出版信息

Phys Rev Lett. 2005 Jul 22;95(4):046102. doi: 10.1103/PhysRevLett.95.046102.

DOI:10.1103/PhysRevLett.95.046102
PMID:16090824
Abstract

The structural (4 x 1) to (8 x 2) transition and the electronic metal to semimetal transition at the In/Si interface are studied with scanning tunneling microscopy and spectroscopy. Both transitions are gradual, resulting in a complex domain structure in the transition temperature regime. At these intermediate temperatures, the metallic (4 x 1) and semimetallic (8 x 2) domains coexist with each other and with new nanophases. By probing the two intertwined but distinguishable transitions at the atomic level, the interaction between different phases is visualized directly.

摘要

利用扫描隧道显微镜和光谱学研究了In/Si界面处的结构从(4×1)到(8×2)的转变以及电子从金属到半金属的转变。这两种转变都是渐进的,在转变温度范围内导致了复杂的畴结构。在这些中间温度下,金属性的(4×1)畴和半金属性的(8×2)畴相互共存,并与新的纳米相共存。通过在原子水平上探测这两个相互交织但又可区分的转变,不同相之间的相互作用得以直接可视化。

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