O'Keefe Michael A, Allard Lawrence F, Blom Douglas A
Materials Sciences Division, Lawrence Berkeley National Laboratory, MS 2R200, 1 Cyclotron Road, Berkeley, CA 94720, USA.
J Electron Microsc (Tokyo). 2005 Jun;54(3):169-80. doi: 10.1093/jmicro/dfi036. Epub 2005 Aug 25.
John Cowley and his group at Arizona State University pioneered the use of transmission electron microscopy for high-resolution imaging. Images were achieved three decades ago showing the crystal unit cell content at better than 4 A resolution. This achievement enabled researchers to pinpoint the positions of heavy atom columns within the unit cell. Lighter atoms appear as resolution is improved to sub-Angström levels. Currently, advanced microscopes can image the columns of the light atoms (carbon, oxygen, nitrogen) that are present in many complex structures, and even the lithium atoms present in some battery materials. Sub-Angström imaging, initially achieved by focal-series reconstruction of the specimen exit surface wave, will become commonplace for next-generation electron microscopes with C(S)-corrected lenses and monochromated electron beams. Resolution can be quantified in terms of peak separation and inter-peak minimum, but the limits imposed on the attainable resolution by the properties of the microscope specimen need to be considered. At extreme resolution the 'size' of atoms can mean that they will not be resolved even when spaced farther apart than the resolution of the microscope.
亚利桑那州立大学的约翰·考利及其团队率先使用透射电子显微镜进行高分辨率成像。三十年前就获得了图像,显示出晶胞内容物的分辨率优于4埃。这一成果使研究人员能够精确确定晶胞内重原子列的位置。随着分辨率提高到亚埃级别,较轻的原子也能显现出来。目前,先进的显微镜能够对许多复杂结构中存在的轻原子(碳、氧、氮)列进行成像,甚至能对某些电池材料中的锂原子成像。最初通过对样品出射面波进行焦系列重建实现的亚埃成像,对于配备C(S)校正透镜和单色电子束的下一代电子显微镜来说将变得很常见。分辨率可以根据峰间距和峰间最小值来量化,但需要考虑显微镜样品特性对可达到分辨率的限制。在极高分辨率下,原子的“尺寸”可能意味着即使它们的间距比显微镜分辨率更远,也无法被分辨出来。