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全细胞的X射线断层扫描。

X-ray tomography of whole cells.

作者信息

Le Gros Mark A, McDermott Gerry, Larabell Carolyn A

机构信息

Physical Biosciences Division, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, MS 6-2100, Berkeley, CA 94720, USA.

出版信息

Curr Opin Struct Biol. 2005 Oct;15(5):593-600. doi: 10.1016/j.sbi.2005.08.008.

Abstract

X-ray tomography has been shown to provide insights into the internal structure of whole cells that can't be obtained by any other means. With recent advances in instrumentation and the advent of automated cryogenic sample stages, it has become possible to collect isotropic tomographic data from radiation-sensitive cells and to compute reconstructions with a high degree of fidelity to a resolution of 50 nm. The new generation of X-ray optics will extend this resolution limit to 15 nm or better. The development of X-ray tomography of whole cells generates opportunities to study cells, and cellular processes, in a completely new way.

摘要

X射线断层扫描已被证明能够洞察整个细胞的内部结构,而这是通过其他任何方式都无法获得的。随着仪器设备的最新进展以及自动化低温样品台的出现,现在已经能够从对辐射敏感的细胞中收集各向同性断层扫描数据,并以高度保真的方式计算重建至50纳米的分辨率。新一代X射线光学器件将把这个分辨率极限扩展到15纳米或更高。全细胞X射线断层扫描技术的发展为以全新方式研究细胞及细胞过程创造了机会。

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