• 文献检索
  • 文档翻译
  • 深度研究
  • 学术资讯
  • Suppr Zotero 插件Zotero 插件
  • 邀请有礼
  • 套餐&价格
  • 历史记录
应用&插件
Suppr Zotero 插件Zotero 插件浏览器插件Mac 客户端Windows 客户端微信小程序
定价
高级版会员购买积分包购买API积分包
服务
文献检索文档翻译深度研究API 文档MCP 服务
关于我们
关于 Suppr公司介绍联系我们用户协议隐私条款
关注我们

Suppr 超能文献

核心技术专利:CN118964589B侵权必究
粤ICP备2023148730 号-1Suppr @ 2026

文献检索

告别复杂PubMed语法,用中文像聊天一样搜索,搜遍4000万医学文献。AI智能推荐,让科研检索更轻松。

立即免费搜索

文件翻译

保留排版,准确专业,支持PDF/Word/PPT等文件格式,支持 12+语言互译。

免费翻译文档

深度研究

AI帮你快速写综述,25分钟生成高质量综述,智能提取关键信息,辅助科研写作。

立即免费体验

单碳线圈电流产生的微磁场的电子全息观测。

Electron holographic observation of micro-magnetic fields current-generated from single carbon coil.

作者信息

Yamamoto Kazuo, Hirayama Tsukasa, Kusunoki Michiko, Yang Shaoming, Motojima Seiji

机构信息

Japan Society for the Promotion of Science (JSPS), c/o Japan Fine Ceramics Center, 2-4-1, Mutsuno, Atsuta, Nagoya 456-8587, Japan.

出版信息

Ultramicroscopy. 2006 Mar;106(4-5):314-9. doi: 10.1016/j.ultramic.2005.10.002. Epub 2005 Nov 18.

DOI:10.1016/j.ultramic.2005.10.002
PMID:16338074
Abstract

A carbon coil was evaluated for use as a micro-solenoid in a small magnetic device. A single carbon coil was lifted out of the aggregate using a tungsten fine probe in a focused ion beam (FIB) system and was wired to two small electrodes in the specimen holder of a transmission electron microscope (TEM). A direct current was supplied to the single carbon coil. A micro/nano-magnetic field generated from the coil was directly observed by electron holography. A computer simulation of electron holography was also done to quantitatively analyze the magnetic field. Details on the FIB technique, the electron holographic observation and the simulation are described.

摘要

对一种碳线圈进行了评估,以确定其在小型磁性装置中用作微螺线管的可行性。在聚焦离子束(FIB)系统中,用钨微探针从聚集体中取出单个碳线圈,并将其连接到透射电子显微镜(TEM)样品架中的两个小电极上。向单个碳线圈施加直流电。通过电子全息术直接观察到线圈产生的微/纳米磁场。还进行了电子全息术的计算机模拟,以定量分析磁场。文中描述了FIB技术、电子全息观察和模拟的详细信息。

相似文献

1
Electron holographic observation of micro-magnetic fields current-generated from single carbon coil.单碳线圈电流产生的微磁场的电子全息观测。
Ultramicroscopy. 2006 Mar;106(4-5):314-9. doi: 10.1016/j.ultramic.2005.10.002. Epub 2005 Nov 18.
2
Conventional and back-side focused ion beam milling for off-axis electron holography of electrostatic potentials in transistors.用于晶体管静电势离轴电子全息术的传统和背侧聚焦离子束铣削。
Ultramicroscopy. 2005 Apr;103(1):67-81. doi: 10.1016/j.ultramic.2004.11.018. Epub 2005 Jan 12.
3
An in situ heating TEM analysis method for an interface reaction.一种用于界面反应的原位加热透射电子显微镜分析方法。
J Electron Microsc (Tokyo). 2009 Oct;58(5):281-7. doi: 10.1093/jmicro/dfp020. Epub 2009 Apr 17.
4
Off-axis electron holography of electrostatic potentials in unbiased and reverse biased focused ion beam milled semiconductor devices.无偏置和反向偏置聚焦离子束铣削半导体器件中静电势的离轴电子全息术。
J Microsc. 2004 Jun;214(Pt 3):287-96. doi: 10.1111/j.0022-2720.2004.01328.x.
5
Electron holography of magnetic field generated by a magnetic recording head.磁记录头产生磁场的电子全息术。
Microscopy (Oxf). 2013 Jun;62(3):383-9. doi: 10.1093/jmicro/dfs090. Epub 2013 Jan 4.
6
2D-mapping of dopant distribution in deep sub micron CMOS devices by electron holography using adapted FIB-preparation.利用适配的聚焦离子束制备技术,通过电子全息术对深亚微米CMOS器件中的掺杂剂分布进行二维映射。
J Electron Microsc (Tokyo). 2005 Aug;54(4):351-9. doi: 10.1093/jmicro/dfi055. Epub 2005 Aug 25.
7
Method for Cross-sectional Thin Specimen Preparation from a Specific Site Using a Combination of a Focused Ion Beam System and Intermediate Voltage Electron Microscope and Its Application to the Characterization of a Precipitate in a Steel.使用聚焦离子束系统和中压电子显微镜组合从特定部位制备横截面薄试样的方法及其在钢中析出物表征中的应用
Microsc Microanal. 2001 May;7(3):287-291.
8
The correlation between ion beam/material interactions and practical FIB specimen preparation.离子束与材料相互作用和实际聚焦离子束样品制备之间的相关性。
Microsc Microanal. 2003 Jun;9(3):216-36. doi: 10.1017/S1431927603030034.
9
Combining Ar ion milling with FIB lift-out techniques to prepare high quality site-specific TEM samples.结合氩离子铣削和聚焦离子束剥离技术来制备高质量的特定位置透射电子显微镜样品。
J Microsc. 2004 Sep;215(Pt 3):219-23. doi: 10.1111/j.0022-2720.2004.01376.x.
10
Off-axis electron holography of unbiased and reverse-biased focused ion beam milled Si p-n junctions.无偏置和反向偏置聚焦离子束铣削硅p-n结的离轴电子全息术。
Microsc Microanal. 2005 Feb;11(1):66-78. doi: 10.1017/S1431927605050087.

引用本文的文献

1
Calibration of multi-layered probes with low/high magnetic moments.多层探针的低/高磁矩校准。
Sci Rep. 2017 Aug 3;7(1):7224. doi: 10.1038/s41598-017-07327-0.
2
Synthesis of Helical Carbon Fibers and Related Materials: A Review on the Past and Recent Developments.螺旋碳纤维及相关材料的合成:过去与近期进展综述
Nanomaterials (Basel). 2015 Jun 2;5(2):937-968. doi: 10.3390/nano5020937.
3
Fabrication of high sensitivity carbon microcoil pressure sensors.高灵敏度碳微线圈压力传感器的制作。
Sensors (Basel). 2012;12(8):10034-41. doi: 10.3390/s120810034. Epub 2012 Jul 25.