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自闭症谱系障碍高功能个体及其父母卓越的脱离嵌入表现:对细微测量方法的需求

Superior disembedding performance of high-functioning individuals with autism spectrum disorders and their parents: the need for subtle measures.

作者信息

de Jonge Maretha V, Kemner Chantal, van Engeland Herman

机构信息

Department of Child and Adolescent Psychiatry, UMC Utrecht, HP B01.201, PO Box 85500, 3508 GA, Utrecht, The Netherlands.

出版信息

J Autism Dev Disord. 2006 Jul;36(5):677-83. doi: 10.1007/s10803-006-0113-2.

Abstract

We assessed the disembedding performance on the Embedded Figures Test (EFT) of high-functioning subjects with autism or autism spectrum disorders from multi-incidence families and the performance of their parents. The individuals with autism spectrum disorders were significantly faster than matched controls in locating the shape, but their parents were not faster than a control group of parents. However, both the individuals with autism spectrum disorders and their fathers made significantly fewer incorrect attempts before finding the right shape than matched controls. These results suggest that the number of incorrect attempts is a more subtle measure than accuracy or response time for assessing superior disembedding skills and therefore may be useful in the assessment of individuals with autism spectrum disorders.

摘要

我们评估了来自多发病率家庭的患有自闭症或自闭症谱系障碍的高功能个体在嵌入式图形测试(EFT)中的分离表现及其父母的表现。患有自闭症谱系障碍的个体在找到形状方面比匹配的对照组明显更快,但他们的父母并不比对照组父母更快。然而,患有自闭症谱系障碍的个体及其父亲在找到正确形状之前所做的错误尝试明显少于匹配的对照组。这些结果表明,对于评估卓越的分离技能而言,错误尝试的次数是比准确性或反应时间更微妙的衡量标准,因此可能有助于评估患有自闭症谱系障碍的个体。

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