单壁碳纳米管的氢化、烃化及蚀刻

Hydrogenation and hydrocarbonation and etching of single-walled carbon nanotubes.

作者信息

Zhang Guangyu, Qi Pengfei, Wang Xinran, Lu Yuerui, Mann David, Li Xiaolin, Dai Hongjie

机构信息

Department of Chemistry and Laboratory for Advanced Materials, Stanford University, Stanford, California 94305, USA.

出版信息

J Am Chem Soc. 2006 May 10;128(18):6026-7. doi: 10.1021/ja061324b.

DOI:10.1021/ja061324b

PMID:16669658

Abstract

We present a systematic experimental investigation of the reactions between hydrogen plasma and single-walled carbon nanotubes (SWNTs) at various temperatures. Microscopy, infrared (IR) and Raman spectroscopy, and electrical transport measurements are carried out to investigate the properties of SWNTs after hydrogenation. Structural deformations, drastically reduced electrical conductance, and an increased semiconducting nature of SWNTs upon sidewall hydrogenation are observed. These changes are reversible upon thermal annealing at 500 degrees C via dehydrogenation. Harsh plasma or high temperature reactions lead to etching of nanotubes likely via hydrocarbonation. Smaller SWNTs are markedly less stable against hydrocarbonation than larger tubes. The results are fundamental and may have implications to basic and practical applications including hydrogen storage, sensing, band gap engineering for novel electronics, and new methods of manipulation, functionalization, and etching of nanotubes.

摘要

我们对氢等离子体与单壁碳纳米管（SWNTs）在不同温度下的反应进行了系统的实验研究。通过显微镜、红外（IR）和拉曼光谱以及电输运测量来研究氢化后SWNTs的性质。观察到侧壁氢化后SWNTs的结构变形、电导大幅降低以及半导体性质增强。在500摄氏度下通过脱氢进行热退火时，这些变化是可逆的。苛刻的等离子体或高温反应可能通过烃化导致纳米管蚀刻。较小的SWNTs对烃化的稳定性明显低于较大的纳米管。这些结果具有基础性意义，可能对包括储氢、传感、新型电子器件的带隙工程以及纳米管的操纵、功能化和蚀刻新方法等基础和实际应用产生影响。