Wenk H R, Heidelbach F, Chateigner D, Zontone F
Laboratoire de Cristallographie, CNRS, Grenoble, France.
J Synchrotron Radiat. 1997 Mar 1;4(Pt 2):95-101. doi: 10.1107/S090904959601432X.
Advantage was taken of the highly focused X-ray beam (10-30 microm) and the broad white spectrum of synchrotron X-rays at the ESRF for automatic recording of Laue patterns from polycrystals and extraction of orientation information. The procedure used is similar to that applied for electron-backscattering patterns in the scanning electron microscope and provides data for local orientation mapping used in texture analysis. Laue patterns are obtained from a thin slice of material in transmission and recorded with a CCD detector. The Laue geometry is converted into a gnomonic projection in which co-zonal reflections lie on straight lines. On applying the Hough transform these lines are merged into a single point, which is recognized by the computer and assigned zone indices [uvw] by comparison with a table of interzonal angles. From the angular positions of several [uvw] the crystal orientation is calculated. The method is illustrated for the orthorhombic magnesium silicate olivine.
利用欧洲同步辐射装置（ESRF）高度聚焦的X射线束（10 - 30微米）和宽白色同步辐射X射线谱，自动记录多晶体的劳厄图案并提取取向信息。所使用的程序类似于扫描电子显微镜中用于电子背散射图案的程序，并为织构分析中使用的局部取向映射提供数据。劳厄图案是从透射的薄片材料中获得的，并用电荷耦合器件（CCD）探测器记录。劳厄几何形状被转换为心射投影，其中共带反射位于直线上。应用霍夫变换后，这些线合并为一个单点，计算机识别该点，并通过与带间角度表比较为其指定晶带指数[uvw]。根据几个[uvw]的角位置计算晶体取向。该方法以正交硅酸镁橄榄石为例进行说明。
