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电化学极化下钙钛矿氧化物表面的原位X射线光电子能谱研究

In situ XPS studies of perovskite oxide surfaces under electrochemical polarization.

作者信息

Vovk Greg, Chen Xiaohua, Mims Charles A

机构信息

Department of Chemistry, University of Toronto, Toronto, Ontario M5S 3E5, Canada.

出版信息

J Phys Chem B. 2005 Feb 17;109(6):2445-54. doi: 10.1021/jp0486494.

Abstract

An in situ XPS study of oxidation-reduction processes on three perovskite oxide electrode surfaces was carried out by incorporating the materials in an electrochemical cell mounted on a heated sample stage in an ultrahigh vacuum (UHV) chamber. Electrodes made of powdered LaCr(1-x)Ni(x)O(3-delta) (x = 0.4, 1) showed changes in the XPS features of all elements upon redox cycling between formal Ni3+ and Ni2+ oxidation stoichiometries, indicating the delocalized nature of the electronic states involved and strong mixing of O 2p to Ni 3d levels to form band states. The surface also showed changes in adsorption capacity for CO2 upon reduction as a result of increased nucleophilicity of surface oxygen. Another perovskite oxide, La(0.5)Sr(0.5)CoO(3-delta), laser deposited as highly oriented thin films on (100) oriented yttria-stabilized zirconia (YSZ), also showed evidence of both local and nonlocal effects in the XPS features upon redox cycling. In contrast to LaCr(1-x)Ni(x)O(3-delta), redox cycling mainly affected the XPS features of cobalt with little effect on oxygen. This signifies reduced participation of O 2p states in the conduction band of this material. Small changes in surface cation stoichiometry in this film were observed and attributed to mobility of the A-site Sr dopant under polarization.

摘要

通过将材料置于安装在超高真空(UHV)腔室中加热样品台上的电化学池中,对三种钙钛矿氧化物电极表面的氧化还原过程进行了原位X射线光电子能谱(XPS)研究。由粉末状LaCr(1-x)Ni(x)O(3-δ)(x = 0.4, 1)制成的电极在形式上的Ni3+和Ni2+氧化化学计量之间进行氧化还原循环时,所有元素的XPS特征都发生了变化,这表明所涉及的电子态具有离域性质,并且O 2p与Ni 3d能级强烈混合形成能带态。由于表面氧亲核性增加,还原后表面对CO2的吸附容量也发生了变化。另一种钙钛矿氧化物La(0.5)Sr(0.5)CoO(3-δ),以高度取向的薄膜形式激光沉积在(100)取向的氧化钇稳定氧化锆(YSZ)上,在氧化还原循环时XPS特征中也显示出局部和非局部效应的证据。与LaCr(1-x)Ni(x)O(3-δ)相比,氧化还原循环主要影响钴的XPS特征,对氧的影响很小。这表明O 2p态在这种材料的导带中的参与度降低。观察到该薄膜表面阳离子化学计量有微小变化,并归因于极化下A位Sr掺杂剂的迁移率。

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