具有双轴对称性薄膜的折射率测量。2. 使用透明波长范围内的偏振透射光谱测定薄膜厚度和折射率。
Refractive index measurements of films with biaxial symmetry. 2. Determination of film thickness and refractive indices using polarized transmission spectra in the transparent wavelength range.
作者信息
Diao Jie, Hess Dennis W
机构信息
School of Chemical and Biomolecular Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332-0100, USA.
出版信息
J Phys Chem B. 2005 Jul 7;109(26):12819-25. doi: 10.1021/jp0462761.
A technique is formulated to determine both thickness and refractive indices of free-standing films with biaxial symmetry from polarized transmission spectra. The films must be transparent and show little dispersion in refractive indices in the wavelength range where the transmission spectra are collected. Methods are proposed to correct the errors caused by imperfect polarization of incident radiation and thickness variation across the sampling area. Anisotropic refractive indices and thickness of poly(biphenyl dianhydride-p-phenylenediamine) films which exhibit uniaxial optical anisotropy are determined from polarized transmission spectra. The refractive index and thickness values compare well to those obtained from waveguide prism coupler and profilometer measurements.
提出了一种从偏振透射光谱确定具有双轴对称性的自支撑薄膜厚度和折射率的技术。这些薄膜必须是透明的，并且在收集透射光谱的波长范围内折射率几乎没有色散。提出了一些方法来校正由入射辐射偏振不完善和整个采样区域厚度变化所引起的误差。从偏振透射光谱确定了具有单轴光学各向异性的聚（联苯二酐 - 对苯二胺）薄膜的各向异性折射率和厚度。折射率和厚度值与通过波导棱镜耦合器和轮廓仪测量得到的值相当吻合。
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