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通过双紫外曝光光刻技术对具有SU-8光刻胶的波导进行可调折射率调制。

Adjustable refractive index modulation for a waveguide with SU-8 photoresist by dual-UV exposure lithography.

作者信息

Ong Biow Hiem, Yuan Xiaocong, Tjin Swee Chuan

机构信息

Photonics Research Center, School of Electrical and Electronic Engineering, Nanyang Technological Univeristy, Singapore.

出版信息

Appl Opt. 2006 Nov 1;45(31):8036-9. doi: 10.1364/ao.45.008036.

Abstract

We present a new fabrication technique based on a two-step UV exposure lithographic process to marginally modulate the refractive index in commercial SU-8 photoresist. This technique achieves refractive index modulation as different regions undergo different thermal densification prior to UV-induced polymerization. A small refractive index contrast of 0.0008 or lower can be achieved, and this is especially useful for fabricating waveguides with a low level of propagation modes. This technique may be extended to other UV-curable epoxy photoresists and can easily be applied in the fabrication of optical elements such as optical interconnects and integrated optical sensors without the development process.

摘要

我们提出了一种基于两步紫外线曝光光刻工艺的新制造技术,用于微调商用SU-8光刻胶中的折射率。该技术通过在紫外线诱导聚合之前不同区域经历不同的热致密化来实现折射率调制。可以实现0.0008或更低的小折射率对比度,这对于制造具有低传播模式水平的波导特别有用。该技术可以扩展到其他紫外线可固化环氧光刻胶,并且可以轻松应用于光学元件的制造,如光学互连和集成光学传感器,而无需显影过程。

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