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精神分裂症与事件相关电位存在大量共同的遗传影响。

Substantial shared genetic influences on schizophrenia and event-related potentials.

作者信息

Hall Mei-Hua, Rijsdijk Frühling, Picchioni Marco, Schulze Katja, Ettinger Ulrich, Toulopoulou Timothea, Bramon Elvira, Murray Robin M, Sham Pak

机构信息

Social, Genetic, and Developmental Psychiatry Research Centre, Division of Psychological Medicine, Institute of Psychiatry, King's College London, UK, and the Psychology Research Laboratory, McLean Hospital, Belmont, MA, USA.

出版信息

Am J Psychiatry. 2007 May;164(5):804-12. doi: 10.1176/ajp.2007.164.5.804.

Abstract

OBJECTIVE

Several components of event-related potentials--P50 suppression, P300 amplitude and latency, and mismatch negativity--have been proposed as potential endophenotypes for schizophrenia on the basis of family studies. The present study used a twin design to estimate the extent of genetic overlap between these indices and the liability to schizophrenia.

METHOD

The authors measured mismatch negativity, P300, and P50 suppression in 16 monozygotic twin pairs concordant for schizophrenia, nine monozygotic twin pairs discordant for schizophrenia, and 78 healthy comparison twin pairs. The study design was based on a power calculation. Structural equation modeling was used to quantify the genetic and environmental contributions to the phenotypic covariance between schizophrenia and each of the event-related potential indices.

RESULTS

Significant phenotypic correlation with schizophrenia was found for each of the event-related potential components. Genetic factors were the main source of the phenotypic correlations. P50 suppression had the greatest genetic correlation with schizophrenia, followed by P300 amplitude, P300 latency, and mismatch negativity.

CONCLUSIONS

All four event-related potential indices are potentially valid endophenotypes for schizophrenia, but P50 suppression and P300 amplitude show the closest genetic relationship to schizophrenia.

摘要

目的

基于家系研究,事件相关电位的几个成分——P50抑制、P300波幅和潜伏期以及失配负波——已被提出作为精神分裂症潜在的内表型。本研究采用双生子设计来估计这些指标与精神分裂症易感性之间的遗传重叠程度。

方法

作者对16对精神分裂症同卵双生子、9对精神分裂症异卵双生子以及78对健康对照双生子进行了失配负波、P300和P50抑制的测量。研究设计基于效能计算。采用结构方程模型来量化遗传和环境因素对精神分裂症与每个事件相关电位指标之间表型协方差的贡献。

结果

发现每个事件相关电位成分与精神分裂症之间存在显著的表型相关性。遗传因素是表型相关性的主要来源。P50抑制与精神分裂症的遗传相关性最大,其次是P300波幅、P300潜伏期和失配负波。

结论

所有四个事件相关电位指标都可能是精神分裂症有效的内表型,但P50抑制和P300波幅与精神分裂症的遗传关系最为密切。

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