Gregoryanz Eugene, Goncharov Alexander F, Sanloup Chrystele, Somayazulu Maddury, Mao Ho-kwang, Hemley Russell J
School of Physics, University of Edinburgh, Edinburgh EH9 3JZ, United Kingdom.
J Chem Phys. 2007 May 14;126(18):184505. doi: 10.1063/1.2723069.
X-ray diffraction and optical spectroscopy techniques are used to characterize stable and metastable transformations of nitrogen compressed up to 170 GPa and heated above 2500 K. X-ray diffraction data show that varepsilon-N2 undergoes two successive structural changes to complex molecular phases zeta at 62 GPa and a newly discovered kappa at 110 GPa. The latter becomes an amorphous narrow gap semiconductor on further compression and if subjected to very high temperatures (approximately 2000 K) crystallizes to the crystalline cubic-gauche-N structure (cg-N) above 150 GPa. The diffraction data show that the transition to cg-N is accompanied by 15% volume reduction.
X射线衍射和光谱技术被用于表征在高达170吉帕压力下压缩并加热至2500 K以上的氮的稳定和亚稳转变。X射线衍射数据表明,ε-N₂在62吉帕时经历两次连续的结构变化,转变为复杂分子相ζ,并在110吉帕时转变为新发现的κ相。后者在进一步压缩时成为非晶态窄带隙半导体,若在非常高的温度(约2000 K)下,则在150吉帕以上结晶为晶体立方- gauche -N结构(cg-N)。衍射数据表明,向cg-N的转变伴随着15%的体积减小。