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采用“中心切割”技术的气相色谱-脉冲放电氦离子化检测法对大宗气体中的杂质进行痕量分析。

Trace analysis of impurities in bulk gases by gas chromatography-pulsed discharge helium ionization detection with "heart-cutting" technique.

作者信息

Weijun Yao

机构信息

Agilent Technologies (Shanghai) Co. Ltd., 412 Yinglun Road, Waigaoqiao Free Trade Zone, Shanghai 200131, China.

出版信息

J Chromatogr A. 2007 Oct 12;1167(2):225-30. doi: 10.1016/j.chroma.2007.08.047. Epub 2007 Aug 26.

Abstract

A method has been developed for the detection of low-nL/L-level impurities in bulk gases such as H(2), O(2), Ar, N(2), He, methane, ethylene and propylene, respectively. The solution presented here is based upon gas chromatography-pulsed discharge helium ionization detection (GC-PDHID) coupled with three two-position valves, one two-way solenoid valve and four packed columns. During the operation, the moisture and heavy compounds are first back-flushed via a pre-column. Then the trace impurities (except CO(2) which is diverted to a separate analytical column for separation and detection) together with the matrix enter onto a main column, followed by the heart-cut of the impurities onto a longer analytical column for complete separation. Finally the detection is performed by PDHID. This method has been applied to different bulk gases and the applicability of detecting impurities in H(2), Ar, and N(2) are herewith demonstrated. As an example, the resulting detection limit of 100 nL/L and a dynamic range of 100-1000 nL/L have been obtained using an Ar sample containing methane.

摘要

已开发出一种分别检测诸如氢气、氧气、氩气、氮气、氦气、甲烷、乙烯和丙烯等大宗气体中低纳升/升水平杂质的方法。此处介绍的解决方案基于气相色谱 - 脉冲放电氦离子化检测(GC - PDHID),它与三个二位阀、一个二位电磁阀和四个填充柱联用。在操作过程中,水分和重质化合物首先通过预柱反吹。然后,痕量杂质(除二氧化碳被转移至单独的分析柱进行分离和检测外)与基体一起进入主柱,接着将杂质中心切割至一根更长的分析柱进行完全分离。最后通过脉冲放电氦离子化检测进行检测。该方法已应用于不同的大宗气体,并在此证明了其对氢气、氩气和氮气中杂质检测的适用性。例如,使用含甲烷的氩气样品获得了100纳升/升的检测限和100 - 1000纳升/升的动态范围。

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