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通过离子研磨制备及对嵌入的H-Nb₂O₅针状晶体进行透射电子显微镜研究。

Preparation by ion milling and TEM investigation of embedded needle-shaped crystals of H-Nb2O5.

作者信息

Krumeich F, Mertin W

机构信息

Institut für Anorganische und Analytische Chemie, Giessen, Federal Republic of Germany.

出版信息

J Electron Microsc Tech. 1991 Nov;19(3):361-5. doi: 10.1002/jemt.1060190310.

DOI:10.1002/jemt.1060190310
PMID:1795188
Abstract

A method for preparing needle-shaped and platelike crystals for electron microscopical investigation was elaborated. Crystals of H-Nb2O5 were embedded in a synthetic resin and disks were cut off perpendicular to the desired direction of observation. The thickness of the sample was reduced by planar grinding and then by using a dimple grinder and furthermore by ion milling with argon ions. With the precision ion milling system small crystal areas were selected and subsequently irradiated. The TEM investigations showed that the desired crystallographic orientation was reached and that the crystal structure has been preserved. The contrast of highly resolved images was reduced by an amorphous surface layer which was not removable.

摘要

阐述了一种制备用于电子显微镜研究的针状和板状晶体的方法。将H-Nb2O5晶体嵌入合成树脂中,并垂直于所需观察方向切割出圆盘。通过平面研磨、然后使用凹坑研磨机以及进一步用氩离子进行离子铣削来减小样品的厚度。使用精密离子铣削系统选择并随后辐照小的晶体区域。透射电子显微镜研究表明达到了所需的晶体学取向并且晶体结构得以保留。高分辨率图像的对比度因不可去除的非晶表面层而降低。

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