Rech Ivan, Ingargiola Antonino, Spinelli Roberto, Labanca Ivan, Marangoni Stefano, Ghioni Massimo, Cova Sergio
Dipartimento di Elettronica e Informazione, Politecnico di Milano, Piazza Leonardo da Vinci 32, 20133 Milano, Italy.
Opt Express. 2008 Jun 9;16(12):8381-94. doi: 10.1364/oe.16.008381.
One of the main issues of Single Photon Avalanche Diode arrays is optical crosstalk. Since its intensity increases with reducing the distance between devices, this phenomenon limits the density of integration within arrays. In the past optical crosstalk was ascribed essentially to the light propagating from one detector to another through direct optical paths. Accordingly, reflecting trenches between devices were proposed to prevent it, but they proved to be not completely effective. In this paper we will present experimental evidence that a significant contribution to optical crosstalk comes from light reflected internally off the bottom of the chip, thus being impossible to eliminate it completely by means of trenches. We will also propose an optical model to predict the dependence of crosstalk on the distance between devices.
单光子雪崩二极管阵列的主要问题之一是光学串扰。由于其强度会随着器件间距离的减小而增加,这种现象限制了阵列中的集成密度。过去,光学串扰主要被归因于光通过直接光路从一个探测器传播到另一个探测器。因此,人们提出在器件之间设置反射沟槽来防止光学串扰,但事实证明它们并不完全有效。在本文中,我们将给出实验证据,证明光学串扰的一个重要来源是芯片底部内部反射的光,因此不可能通过沟槽完全消除它。我们还将提出一个光学模型来预测串扰与器件间距离的关系。