Grabolle Markus, Ziegler Jan, Merkulov Alexei, Nann Thomas, Resch-Genger Ute
Federal Institute for Materials Research and Testing, Department I.5, Richard-Willstaetter-Str. 11, 12489 Berlin, Germany.
Ann N Y Acad Sci. 2008;1130:235-41. doi: 10.1196/annals.1430.021.
We investigated the correlation between the thickness of the ZnS shell of CdSe-ZnS quantum dots (QDs), the stability of the particles, and the fluorescence quantum yield. As a measure for stability, a new shell quality test was developed. This test is based on the reaction of the QDs with photochemically formed thiophenol radicals and communicates an imperfect ZnS shell by a rapid and complete loss of fluorescence. The quantum yield increases from less than 5% for unshelled CdSe up to 50%, with an increase in ZnS shell thickness up to 0.6-0.8 nm. At the same time, the particles become significantly more stable, as revealed by the shell test.
我们研究了CdSe-ZnS量子点(QDs)的ZnS壳层厚度、颗粒稳定性与荧光量子产率之间的相关性。作为稳定性的一种衡量方法,我们开发了一种新的壳层质量测试。该测试基于量子点与光化学形成的苯硫酚自由基的反应,并通过荧光的快速完全丧失来表明ZnS壳层存在缺陷。随着ZnS壳层厚度增加至0.6 - 0.8 nm,未包覆的CdSe量子点的量子产率从不超过5%提高到了50%。与此同时,如壳层测试所示,颗粒的稳定性显著提高。