Poher Vincent, Kennedy Gordon T, Manning Hugh B, Owen Dylan M, Zhang Haoxiang X, Gu Erdan, Dawson Martin D, French Paul M W, Neil Mark A A
Photonics Group, Blackett Laboratory, Department of Chemistry, Imperial College London, London, UK.
Opt Lett. 2008 Aug 15;33(16):1813-5. doi: 10.1364/ol.33.001813.
We describe a simple implementation of a slit scanning confocal microscope to obtain an axial resolution better than that of a point-scanning confocal microscope. Under slit illumination, images of a fluorescent object are captured using an array detector instead of a line detector so that out-of-focus light is recorded and then subtracted from the adjacent images. Axial resolution after background subtraction is 2.2 times better than the slit confocal resolution, and out-of-focus image suppression is calculated to attenuate with defocus faster by 1 order of magnitude than in the point confocal case.
我们描述了一种狭缝扫描共聚焦显微镜的简单实现方法，以获得比点扫描共聚焦显微镜更好的轴向分辨率。在狭缝照明下，使用阵列探测器而非线探测器来捕获荧光物体的图像，以便记录离焦光，然后从相邻图像中减去。背景扣除后的轴向分辨率比狭缝共聚焦分辨率提高了2.2倍，并且计算得出离焦图像抑制随离焦的衰减速度比点共聚焦情况快1个数量级。
