Brunet P, Lapierre F, Thomy V, Coffinier Y, Boukherroub R
Laboratoire de Mecanique de Lille, UMR CNRS 8107, Bd. Paul Langevin, 59655 Villeneuve d'Ascq, France.
Langmuir. 2008 Oct 7;24(19):11203-8. doi: 10.1021/la801268v. Epub 2008 Aug 27.
The paper reports on the comparison of the wetting properties of superhydrophobic silicon nanowires (NWs), using drop impact impalement and electrowetting (EW) experiments. A correlation between the resistance to impalement on both EW and drop impact is shown. From the results, it is evident that when increasing the length and density of NWs (i) the thresholds for drop impact and EW irreversibility increase and (ii) the contact-angle hysteresis after impalement decreases. This suggests that the structure of the NW network could allow for partial impalement, hence preserving the reversibility, and that EW acts the same way as an external pressure. The most robust of our surfaces shows a threshold to impalement higher than 35 kPa, while most of the superhydrophobic surfaces tested so far have impalement thresholds smaller than 10 kPa.
该论文报道了利用液滴冲击穿刺和电润湿(EW)实验对超疏水硅纳米线(NWs)润湿性的比较。结果表明了在电润湿和液滴冲击时抗穿刺性之间的相关性。从结果可以明显看出,当增加纳米线的长度和密度时,(i)液滴冲击和电润湿不可逆性的阈值增加,并且(ii)穿刺后的接触角滞后减小。这表明纳米线网络结构可能允许部分穿刺,从而保持可逆性,并且电润湿的作用方式与外部压力相同。我们最坚固的表面显示出高于35 kPa的穿刺阈值,而迄今为止测试的大多数超疏水表面的穿刺阈值小于10 kPa。