Griffith O H, Engel W
Institute of Molecular Biology, University of Oregon, Eugene 97403.
Ultramicroscopy. 1991 May;36(1-3):1-28. doi: 10.1016/0304-3991(91)90135-s.
Emission microscopes and related instruments comprise a specialized class of electron microscopes that have in common an acceleration field in combination with the first stage of imaging (i.e., an immersion objective lens, also called a cathode lens or emission lens). These imaging techniques include photoelectron emission microscopy (PEEM or PEM), electron emission induced by heat, ions, or neutral particles, mirror electron microscopy (MEM), and low-energy electron microscopy (LEEM), among others. In these instruments the specimen is placed on a flat cathode or is the cathode itself. The low-energy electrons that are emitted, reflected, or backscattered from the specimen are first accelerated and then imaged by means of an electron lens system resembling that of a transmission electron microscope. The image is formed in a parallel mode in all of the above instruments, in contrast to the image in scanning electron microscopes, where the information is collected sequentially by scanning the specimen. A brief history and introduction to emission microscopy, MEM, and LEEM is presented as a background for the Proceedings of the Second International Symposium and Workshop on this subject, held in Seattle, Washington, August 16-17, 1990. Current trends in this field gleaned from the presentations at that meeting are discussed.
发射显微镜及相关仪器属于一类特殊的电子显微镜，它们的共同特点是具有一个加速场，并与成像的第一阶段相结合（即浸没物镜，也称为阴极透镜或发射透镜）。这些成像技术包括光电子发射显微镜（PEEM或PEM）、由热、离子或中性粒子诱导的电子发射、镜像电子显微镜（MEM）和低能电子显微镜（LEEM）等。在这些仪器中，样品放置在平坦的阴极上或样品本身就是阴极。从样品发射、反射或背散射的低能电子首先被加速，然后通过类似于透射电子显微镜的电子透镜系统成像。与扫描电子显微镜中通过扫描样品顺序收集信息形成的图像不同，上述所有仪器中的图像都是以平行模式形成的。作为1990年8月16 - 17日在华盛顿州西雅图举行的第二届关于该主题的国际研讨会和讲习班会议记录的背景，介绍了发射显微镜、MEM和LEEM的简要历史。讨论了从该会议的报告中收集到的该领域的当前趋势。
