Tomlins Peter H, Woolliams Peter, Hart Christian, Beaumont Andrew, Tedaldi Matthew
Biophotonics Group, National Physical Laboratory, Hampton Road, Teddington, Middlesex, UK.
Opt Lett. 2008 Oct 1;33(19):2272-4. doi: 10.1364/ol.33.002272.
We introduce a novel approach to refractometry using a low coherence interferometer at multiple angles of incidence. We show that for plane parallel samples it is possible to measure their phase refractive index rather than the group index that is usually measured by interferometric methods. This is a significant development because it enables bulk refractive index measurement of scattering and soft samples, not relying on surface measurements that can be prone to error. Our technique is also noncontact and compatible with in situ refractive index measurements. Here, we demonstrate this new technique on a pure silica test piece and a highly scattering resin slab, comparing the results with standard critical angle refractometry.
我们介绍了一种使用低相干干涉仪在多个入射角下进行折射测量的新方法。我们表明，对于平面平行样品，可以测量其相折射率，而不是通常通过干涉测量方法测量的群折射率。这是一项重大进展，因为它能够对散射和软样品进行体折射率测量，而不依赖于可能容易出错的表面测量。我们的技术也是非接触式的，并且与原位折射率测量兼容。在这里，我们在纯二氧化硅测试片和高散射树脂板上演示了这项新技术，并将结果与标准临界角折射测量法进行了比较。
