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泄漏和电压激活的钾通道门控中的反向耦合是电信号传导中不同作用的基础。

Inverse coupling in leak and voltage-activated K+ channel gates underlies distinct roles in electrical signaling.

作者信息

Ben-Abu Yuval, Zhou Yufeng, Zilberberg Noam, Yifrach Ofer

机构信息

Department of Life Sciences and the Zlotowski Center for Neuroscience, Ben-Gurion University of the Negev, P.O. Box 653, Beer Sheva 84105, Israel.

出版信息

Nat Struct Mol Biol. 2009 Jan;16(1):71-9. doi: 10.1038/nsmb.1525. Epub 2008 Dec 21.

Abstract

Voltage-activated (Kv) and leak (K(2P)) K(+) channels have key, yet distinct, roles in electrical signaling in the nervous system. Here we examine how differences in the operation of the activation and slow inactivation pore gates of Kv and K(2P) channels underlie their unique roles in electrical signaling. We report that (i) leak K(+) channels possess a lower activation gate, (ii) the activation gate is an important determinant controlling the conformational stability of the K(+) channel pore, (iii) the lower activation and upper slow inactivation gates of leak channels cross-talk and (iv) unlike Kv channels, where the two gates are negatively coupled, these two gates are positively coupled in K(2P) channels. Our results demonstrate how basic thermodynamic properties of the K(+) channel pore, particularly conformational stability and coupling between gates, underlie the specialized roles of Kv and K(2P) channel families in electrical signaling.

摘要

电压门控(Kv)钾通道和渗漏(K(2P))钾通道在神经系统的电信号传导中发挥着关键但不同的作用。在此,我们研究Kv通道和K(2P)通道激活门与缓慢失活孔道门操作上的差异如何构成它们在电信号传导中独特作用的基础。我们报告如下:(i)渗漏钾通道具有较低的激活门;(ii)激活门是控制钾通道孔道构象稳定性的重要决定因素;(iii)渗漏通道的较低激活门和较高缓慢失活门相互影响;(iv)与Kv通道中两个门呈负性偶联不同,在K(2P)通道中这两个门呈正性偶联。我们的结果表明,钾通道孔道的基本热力学性质,特别是构象稳定性和门之间的偶联,是Kv通道家族和K(2P)通道家族在电信号传导中发挥特殊作用的基础。

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