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一种利用X射线计算机断层扫描研究新鲜植物结构的新制备方法。

A new preparation method to study fresh plant structures with X-ray computed tomography.

作者信息

Leroux O, Leroux F, Bellefroid E, Claeys M, Couvreur M, Borgonie G, Van Hoorebeke L, Masschaele B, Viane R

机构信息

Research Group Pteridology, Department of Biology, Ghent University, K.L. Ledeganckstraat 35, B-9000 Ghent, Belgium.

出版信息

J Microsc. 2009 Jan;233(1):1-4. doi: 10.1111/j.1365-2818.2008.03088.x.

Abstract

Since the development of X-ray computed tomography as a medical diagnostic tool, it was adapted and extended for many scientific applications, including plant structure research. As for many biological studies, sample preparation is of major importance to obtain good-quality images. Therefore, we present a new preparation method for fresh material which includes critical point drying and heavy metal staining. This technique enhances the contrast of fresh tissues, prevents artefacts such as tissue compression, and requires no embedding.

摘要

自从X射线计算机断层扫描作为一种医学诊断工具发展以来,它已被改编并扩展用于许多科学应用,包括植物结构研究。对于许多生物学研究而言,样品制备对于获得高质量图像至关重要。因此,我们提出了一种针对新鲜材料的新制备方法,该方法包括临界点干燥和重金属染色。这种技术增强了新鲜组织的对比度,防止了诸如组织压缩等伪像,并且无需包埋。

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