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薄膜半导体忆阻行为的耦合离子与电子输运模型

Coupled ionic and electronic transport model of thin-film semiconductor memristive behavior.

作者信息

Strukov Dmitri B, Borghetti Julien L, Williams R Stanley

机构信息

Hewlett-Packard Laboratories, Palo Alto, CA 94304, USA.

出版信息

Small. 2009 May;5(9):1058-63. doi: 10.1002/smll.200801323.

Abstract

The memristor, the fourth passive circuit element, was predicted theoretically nearly 40 years ago, but we just recently demonstrated both an intentional material system and an analytical model that exhibited the properties of such a device. Here we provide a more physical model based on numerical solutions of coupled drift-diffusion equations for electrons and ions with appropriate boundary conditions. We simulate the dynamics of a two-terminal memristive device based on a semiconductor thin film with mobile dopants that are partially compensated by a small amount of immobile acceptors. We examine the mobile ion distributions, zero-bias potentials, and current-voltage characteristics of the model for both steady-state bias conditions and for dynamical switching to obtain physical insight into the transport processes responsible for memristive behavior in semiconductor films.

摘要

忆阻器作为第四个无源电路元件,早在近40年前就从理论上被预言了,但直到最近我们才证明了一种有意设计的材料系统以及一个展现出此类器件特性的分析模型。在此,我们基于具有适当边界条件的电子和离子耦合漂移扩散方程的数值解,提供了一个更具物理意义的模型。我们模拟了一种基于半导体薄膜的两端忆阻器件的动力学过程,该薄膜中的可移动掺杂剂被少量不可移动的受主部分补偿。我们研究了该模型在稳态偏置条件下以及动态切换时的可移动离子分布、零偏置电势和电流 - 电压特性,以深入了解半导体薄膜中导致忆阻行为的输运过程。

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