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挥发性和非挥发性卤化物钙钛矿器件的动力学:电导激活准线性忆阻器(CALM)模型

Kinetics of Volatile and Nonvolatile Halide Perovskite Devices: The Conductance-Activated Quasi-Linear Memristor (CALM) Model.

作者信息

Bou Agustín, Gonzales Cedric, Boix Pablo P, Vaynzof Yana, Guerrero Antonio, Bisquert Juan

机构信息

Chair for Emerging Electronic Technologies, Technical University of Dresden, Nöthnitzer Str. 61, 01187 Dresden, Germany.

Leibniz-Institute for Solid State and Materials Research Dresden, Helmholtzstraße 20, 01069 Dresden, Germany.

出版信息

J Phys Chem Lett. 2025 Jan 9;16(1):69-76. doi: 10.1021/acs.jpclett.4c03132. Epub 2024 Dec 19.

Abstract

Memristors stand out as promising components in the landscape of memory and computing. Memristors are generally defined by a conductance mechanism containing a state variable that imparts a memory effect. The current-voltage cycling causes transitions of conductance, which are determined by different physical mechanisms, such as the formation of conducting filaments in an insulating surrounding. Here, we provide a unified description of the set and reset processes using a conductance-activated quasi-linear memristor (CALM) model with a unique voltage-dependent relaxation time of the memory variable. We focus on halide perovskite memristors and their intersection with neuroscience-inspired computing. We show that the modeling approach adeptly replicates the experimental traits of both volatile and nonvolatile memristors. Its versatility extends across various device materials and configurations, as W/SiGe/a-Si/Ag, Si/SiO/Ag, and SrRuO/Cr-SrZrO/Au memristors, capturing nuanced behaviors such as scan rate and upper vertex dependence. The model also describes the response to sequences of voltage pulses that cause synaptic potentiation effects. This model is a potent tool for comprehending and probing the dynamical response of memristors by indicating the relaxation properties that control observable responses.

摘要

忆阻器在内存和计算领域中是很有前景的组件。忆阻器通常由一种包含状态变量的电导机制定义,该状态变量赋予其记忆效应。电流-电压循环会导致电导的转变,这由不同的物理机制决定,比如在绝缘环境中形成导电细丝。在此,我们使用一种具有记忆变量独特电压依赖性弛豫时间的电导激活准线性忆阻器(CALM)模型,对设置和重置过程进行统一描述。我们聚焦于卤化物钙钛矿忆阻器及其与神经科学启发式计算的交叉领域。我们表明,该建模方法能够巧妙地复制易失性和非易失性忆阻器的实验特性。其通用性涵盖各种器件材料和配置,如W/SiGe/a-Si/Ag、Si/SiO/Ag和SrRuO/Cr-SrZrO/Au忆阻器,能够捕捉诸如扫描速率和上顶点依赖性等细微行为。该模型还描述了对引起突触增强效应的电压脉冲序列的响应。通过指出控制可观测响应的弛豫特性,此模型是理解和探究忆阻器动态响应的有力工具。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6647/11726628/a7bfdb844750/jz4c03132_0001.jpg

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