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Cc校正成像在高分辨率和能量过滤透射电子显微镜中的首次应用。

First application of Cc-corrected imaging for high-resolution and energy-filtered TEM.

作者信息

Kabius Bernd, Hartel Peter, Haider Maximilian, Müller Heiko, Uhlemann Stephan, Loebau Ulrich, Zach Joachim, Rose Harald

机构信息

Argonne National Laboratory, Argonne IL 60439, USA.

出版信息

J Electron Microsc (Tokyo). 2009 Jun;58(3):147-55. doi: 10.1093/jmicro/dfp021. Epub 2009 Apr 27.

Abstract

Contrast-transfer calculations indicate that C(c) correction should be highly beneficial for high-resolution and energy-filtered transmission electron microscopy. A prototype of an electron optical system capable of correcting spherical and chromatic aberration has been used to verify these calculations. A strong improvement in resolution at an acceleration voltage of 80 kV has been measured. Our first C(c)-corrected energy-filtered experiments examining a (LaAlO(3))(0.3)(Sr(2)AlTaO(6))(0.7)/LaCoO(3) interface demonstrated a significant gain for the spatial resolution in elemental maps of La.

摘要

对比传递计算表明,C(c)校正对于高分辨率和能量过滤透射电子显微镜应该非常有益。一种能够校正球差和色差的电子光学系统原型已被用于验证这些计算。在80 kV加速电压下,分辨率有了显著提高。我们首次对(LaAlO(3))(0.3)(Sr(2)AlTaO(6))(0.7)/LaCoO(3)界面进行的C(c)校正能量过滤实验表明,在La的元素图中,空间分辨率有了显著提高。

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