Lee Jennifer Y, Noordhoek Mark J, Smereka Peter, McKay Hugh, Millunchick Joanna M
Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI 48109, USA.
Nanotechnology. 2009 Jul 15;20(28):285305. doi: 10.1088/0957-4484/20/28/285305. Epub 2009 Jun 23.
Focused ion beams are used to pattern GaAs(001) surfaces with an array of nanometer-deep holes upon which deposition of InAs results in quantum dot formation at the hole location. Experiments show that the size and quantity of quantum dots formed depend on growth parameters, and ion dose, which affects the size and shape of the resulting holes. Quantum dots fabricated in this fashion have a photoluminescence peak at 1.28 eV at 77 K, indicating that the ion irradiation due to patterning does not destroy their optical activity. Kinetic Monte Carlo simulations that include elastic relaxation qualitatively model the growth of dots in nanometer-deep holes, and demonstrate that growth temperature, depth of the holes, and the angle of the hole sidewalls strongly influence the number of quantum dots that form at their perimeter.
聚焦离子束用于在GaAs(001)表面刻蚀出一系列纳米深的孔阵列,在这些孔上沉积InAs会导致在孔位置形成量子点。实验表明,形成的量子点的尺寸和数量取决于生长参数以及离子剂量,离子剂量会影响所形成孔的尺寸和形状。以这种方式制造的量子点在77 K时具有1.28 eV的光致发光峰,这表明图案化引起的离子辐照不会破坏其光学活性。包含弹性弛豫的动力学蒙特卡罗模拟定性地模拟了纳米深孔中量子点的生长,并表明生长温度、孔的深度以及孔侧壁的角度强烈影响在其周边形成的量子点的数量。