通过有机分子固体烧蚀确定的聚焦软X射线自由电子激光束的特性

Characteristics of focused soft X-ray free-electron laser beam determined by ablation of organic molecular solids.

作者信息

Chalupský J, Juha L, Kuba J, Cihelka J, Hájková V, Koptyaev S, Krása J, Velyhan A, Bergh M, Caleman C, Hajdu J, Bionta R M, Chapman H, Hau-Riege S P, London R A, Jurek M, Krzywinski J, Nietubyc R, Pelka J B, Sobierajski R, Meyer-Ter-Vehn J, Tronnier A, Sokolowski-Tinten K, Stojanovic N, Tiedtke K, Toleikis S, Tschentscher T, Wabnitz H, Zastrau U

机构信息

Institute of Physics, Academy of Sciences of the Czech Republic, Na Slovance 2, 182 21 Prague 8, Czech Republic.

出版信息

Opt Express. 2007 May 14;15(10):6036-43. doi: 10.1364/oe.15.006036.

DOI:10.1364/oe.15.006036

PMID:19546907

Abstract

A linear accelerator based source of coherent radiation, FLASH (Free-electron LASer in Hamburg) provides ultra-intense femtosecond radiation pulses at wavelengths from the extreme ultraviolet (XUV; lambda<100nm) to the soft X-ray (SXR; lambda<30nm) spectral regions. 25-fs pulses of 32-nm FLASH radiation were used to determine the ablation parameters of PMMA - poly (methyl methacrylate). Under these irradiation conditions the attenuation length and ablation threshold were found to be (56.9+/-7.5) nm and approximately 2 mJ*cm(-2), respectively. For a second wavelength of 21.7 nm, the PMMA ablation was utilized to image the transverse intensity distribution within the focused beam at mum resolution by a method developed here.

摘要

基于直线加速器的相干辐射源FLASH（汉堡自由电子激光），能在从极紫外（XUV；波长<100nm）到软X射线（SXR；波长<30nm）的光谱区域提供超强飞秒辐射脉冲。利用32nm的FLASH辐射的25飞秒脉冲来确定聚甲基丙烯酸甲酯（PMMA）的烧蚀参数。在这些辐照条件下，衰减长度和烧蚀阈值分别为(56.9±7.5)nm和约2mJ·cm⁻²。对于21.7nm的第二个波长，通过这里开发的一种方法，利用PMMA烧蚀以微米分辨率对聚焦光束内的横向强度分布进行成像。