Paul Scherrer Institut, CH-5232 Villigen, Switzerland.
Sci Rep. 2011;1:57. doi: 10.1038/srep00057. Epub 2011 Aug 8.
A growing number of X-ray sources based on the free-electron laser (XFEL) principle are presently under construction or have recently started operation. The intense, ultrashort pulses of these sources will enable new insights in many different fields of science. A key problem is to provide x-ray optical elements capable of collecting the largest possible fraction of the radiation and to focus into the smallest possible focus. As a key step towards this goal, we demonstrate here the first nanofocusing of hard XFEL pulses. We developed diamond based Fresnel zone plates capable of withstanding the full beam of the world's most powerful x-ray laser. Using an imprint technique, we measured the focal spot size, which was limited to 320 nm FWHM by the spectral band width of the source. A peak power density in the focal spot of 4×10(17)W/cm(2) was obtained at 70 fs pulse length.
目前,越来越多的基于自由电子激光(XFEL)原理的 X 射线源正在建设或最近开始运行。这些光源的高强度、超短脉冲将为许多不同领域的科学研究带来新的见解。一个关键问题是提供能够收集尽可能大的辐射部分并聚焦到尽可能小的焦点的 X 射线光学元件。作为实现这一目标的关键步骤,我们在这里展示了硬 XFEL 脉冲的首次纳米聚焦。我们开发了能够承受世界上最强大的 X 射线激光的完整光束的基于金刚石的菲涅耳波带片。使用压印技术,我们测量了焦点光斑尺寸,其受到光源的光谱带宽限制,半高全宽为 320nm。在 70fs 脉冲长度下,在焦点处获得了 4×10(17)W/cm(2)的峰值功率密度。