Bobby R. Alford Department of Otolaryngology-Head and Neck Surgery, Baylor College of Medicine, Hearing Center at Texas Children's Hospital, Houston, Texas 77030, USA.
Laryngoscope. 2010 Feb;120(2):399-404. doi: 10.1002/lary.20668.
OBJECTIVES/HYPOTHESIS: To examine the characteristics of pediatric cochlear implant channel malfunction preceding device failure.
: Retrospective review.
All pediatric patients who underwent cochlear implantation at a tertiary academic medical center were reviewed regarding device type, reason for replacement, time to replacement, and timing and pattern of channel faults in failed versus nonfailed devices.
Between 1993 and 2008, 264 pediatric cochlear implantations were performed. With an average 894-day follow-up, the replacement rate was 9.5% (25/264). Reasons for replacement were device failure (6.4%), medical/surgical failure (2.3%), and obsolescence (0.8%). Replacement rates were comparable among Advanced Bionics (13.3%), Cochlear Corporation (6.3%), and MED-EL (10.3%) devices. Fifty-two cochlear implants developed at least one channel fault, and 13 eventually progressed to failure requiring replacement. MED-EL devices comprised 12 of these 13 failures. At the 12-month follow-up interval, one, three, and five channel faults predicted 40%, 75%, and 100% probabilities of eventual electrode failure, respectively. Channels destined to fail demonstrated small, yet statistically significant, impedance elevations 12 months before failure and large elevations 3 months before failure.
Replacement of cochlear implants in pediatric patients is common and is due to device malfunction about one half of the time. Earlier initial channel fault, earlier subsequent channel faults, adjacent channel faults, and a greater total number of channel faults were associated with the need for replacement surgery. Elevations in a channel's impedance should raise the concern for an impending failure. These predictors can help the cochlear implant team when considering surgery to replace the device.
目的/假设:研究儿童耳蜗植入通道故障在设备故障前的特征。
回顾性研究。
对在一家三级学术医疗中心接受耳蜗植入的所有儿科患者进行了设备类型、更换原因、更换时间以及故障与非故障设备的通道故障时间和模式的回顾。
1993 年至 2008 年间,共进行了 264 例儿科耳蜗植入术。平均随访 894 天后,更换率为 9.5%(25/264)。更换的原因包括设备故障(6.4%)、医疗/手术失败(2.3%)和过时(0.8%)。先进仿生(13.3%)、科利尔公司(6.3%)和 MED-EL(10.3%)设备的更换率相似。52 个耳蜗植入物发生了至少一次通道故障,其中 13 个最终发展为需要更换的故障。这 13 个故障中有 12 个是 MED-EL 设备。在 12 个月的随访间隔,一个、三个和五个通道故障分别预测最终电极故障的概率为 40%、75%和 100%。注定要失败的通道在故障前 12 个月显示出微小但统计学上显著的阻抗升高,而在故障前 3 个月显示出较大的升高。
在儿科患者中更换耳蜗植入物很常见,大约一半的原因是设备故障。较早的初始通道故障、随后的通道故障、相邻通道故障以及更多的通道故障总数与需要更换手术有关。通道阻抗的升高应引起对即将发生的故障的关注。这些预测因子可以帮助耳蜗植入团队在考虑手术更换设备时提供帮助。