Hunter W R
E. 0. Hulburt Center for Space Research,The Naval Research Laboratory, Washington, DC 20390, USA.
Appl Opt. 1967 Dec 1;6(12):2140-50. doi: 10.1364/AO.6.002140.
The accuracy with which the angle of incidence phi and the reflectance R can be measured determines the accuracy with which the optical constants: n the index of refraction and k the extinction coefficient, can be determined when using the reflectance vs angle of incidence method. There are certain characteristics of reflectometers and associated equipment that contribute to the errors in measuring R and phi, for example, mechanical problems such as mirror misalignment or misalignment of the optical axes of the reflectometer and source of radiation, optical problems such as nonuniform illumination and nonuniform detector response, fluctuations in intensity of the radiation source and stray light. A discussion of these errors and ways to eliminate or alleviate them is presented, and it is shown how these correcting features can be incorporated into the design of a reflectometer.
入射角φ和反射率R的测量精度决定了在使用反射率与入射角方法时,光学常数(折射率n和消光系数k)的确定精度。反射计及相关设备的某些特性会导致测量R和φ时产生误差,例如,机械问题,如镜子未对准或反射计与辐射源光轴未对准;光学问题,如照明不均匀和探测器响应不均匀;辐射源强度波动和杂散光。本文讨论了这些误差以及消除或减轻它们的方法,并展示了如何将这些校正特性纳入反射计的设计中。