Hunderi O
Appl Opt. 1972 Jul 1;11(7):1572-8. doi: 10.1364/AO.11.001572.
We describe a new method for obtaining the optical constants of a material based upon measurement of the relative derivative of reflectance with angle of incidence (1/R)(dR/dtheta). The systematic optical errors in this system were reduced to about 5 x 10(-4) rad(-1). The relative accuracy in (1/R)(dR/dtheta) was then typically five times better than the relative accuracy in the optical absorptance (1 - R(0)) measured in a standard reflectometer. Systematic calibration errors were comparable with those for a reflectometer and were about 0.6%. Used in conjunction with a normal incidence reflectometer, the system provides the optical constants of materials in regions where the reflectivity is not high. When the reflectivity approaches unity, as it does for metals in the ir, the measured quantity (for light of both polarizations) becomes proportional to 1 - R(0) and may be used to measure the absorptance of a sample with an accuracy of about 3%.
我们描述了一种基于测量反射率随入射角的相对导数(1/R)(dR/dθ)来获取材料光学常数的新方法。该系统中的系统光学误差被降低到约5×10⁻⁴弧度⁻¹。(1/R)(dR/dθ)的相对精度通常比在标准反射计中测量的光吸收率(1 - R(0))的相对精度高五倍。系统校准误差与反射计的校准误差相当，约为0.6%。与垂直入射反射计结合使用时，该系统可在反射率不高的区域提供材料的光学常数。当反射率接近1时，就像红外波段的金属那样，测量量（对于两种偏振光）与1 - R(0)成正比，可用于以约3%的精度测量样品的吸收率。
