Department of Mechanical Engineering, University of Maryland, College Park, MD 20742, USA.
Nanotechnology. 2010 Feb 19;21(7):75702. doi: 10.1088/0957-4484/21/7/075702. Epub 2010 Jan 18.
A spectral analysis method has been recently introduced by Stark et al (2002 Proc. Natl Acad. Sci. USA 99 8473-8) and implemented by Sahin et al (2007 Nat. Nanotechnol. 2 507-14) using a T-shaped cantilever design, the torsional harmonic cantilever (THC), which is capable of performing simultaneous tapping-mode atomic force microscopy imaging and force spectroscopy. Here we report on numerical simulations of the THC system using a simple dual-mass flexural-torsional model, which is applied in combination with Fourier data processing software to illustrate the spectroscopy process for quality factors corresponding to liquid, air and vacuum environments. We also illustrate the acquisition of enhanced topographical images and deformed surface contours under the application of uniform forces, and compare the results to those obtained with a previously reported linear dual-spring-mass model.
斯塔克等人（2002 年《美国国家科学院院刊》99 8473-8）最近提出了一种光谱分析方法，并由萨欣等人（2007 年《自然·纳米技术》2 507-14）采用 T 形悬臂梁设计（扭转谐悬臂梁 THC）实现，该设计能够同时进行敲击模式原子力显微镜成像和力谱学研究。本文采用简单的双质量弯曲-扭转模型对 THC 系统进行了数值模拟，并结合傅里叶数据分析软件说明了对应于液体、空气和真空环境的品质因数的光谱学过程。我们还说明了在施加均匀力时如何获得增强的形貌图像和变形的表面轮廓，并将结果与之前报道的线性双弹簧质量模型的结果进行了比较。
