Department of Electrical and Computer Engineering, Beckman Institute for Advanced Science and Technology,University of Illinois at Urbana-Champaign, Urbana, Illinois 61801, USA.
Opt Lett. 2010 Jan 15;35(2):208-10. doi: 10.1364/OL.35.000208.
Spatial light interference microscopy (SLIM) is a novel method developed in our laboratory that provides quantitative phase images of transparent structures with a 0.3 nm spatial and 0.03 nm temporal accuracy owing to the white light illumination and its common path interferometric geometry. We exploit these features and demonstrate SLIM's ability to perform topography at a single atomic layer in graphene. Further, using a decoupling procedure that we developed for cylindrical structures, we extract the axially averaged refractive index of semiconductor nanotubes and a neurite of a live hippocampal neuron in culture. We believe that this study will set the basis for novel high-throughput topography and refractometry of man-made and biological nanostructures.
空间光干涉显微镜（SLIM）是我们实验室开发的一种新方法，由于采用了白光照明及其共光路干涉几何结构，该方法可以提供具有 0.3nm 空间和 0.03nm 时间精度的透明结构定量相位图像。我们利用这些特性，展示了 SLIM 在单层石墨烯上进行形貌测量的能力。此外，我们使用针对圆柱结构开发的解耦程序，提取了半导体纳米管和培养的活海马神经元神经突的轴向平均折射率。我们相信，这项研究将为新型人造和生物纳米结构的高通量形貌和折射率测量奠定基础。
