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使用 SIMD 扩展进行矢量化可加速电子断层扫描重建。

Vectorization with SIMD extensions speeds up reconstruction in electron tomography.

机构信息

Dept. Computer Architecture, University of Almeri a, 04120 Almeri a, Spain.

出版信息

J Struct Biol. 2010 Jun;170(3):570-5. doi: 10.1016/j.jsb.2010.01.008. Epub 2010 Jan 18.

Abstract

Electron tomography allows structural studies of cellular structures at molecular detail. Large 3D reconstructions are needed to meet the resolution requirements. The processing time to compute these large volumes may be considerable and so, high performance computing techniques have been used traditionally. This work presents a vector approach to tomographic reconstruction that relies on the exploitation of the SIMD extensions available in modern processors in combination to other single processor optimization techniques. This approach succeeds in producing full resolution tomograms with an important reduction in processing time, as evaluated with the most common reconstruction algorithms, namely WBP and SIRT. The main advantage stems from the fact that this approach is to be run on standard computers without the need of specialized hardware, which facilitates the development, use and management of programs. Future trends in processor design open excellent opportunities for vector processing with processor's SIMD extensions in the field of 3D electron microscopy.

摘要

电子断层扫描允许在分子细节上对细胞结构进行结构研究。需要进行大型 3D 重建以满足分辨率要求。计算这些大体积的处理时间可能会相当长,因此传统上使用了高性能计算技术。这项工作提出了一种基于向量的断层重建方法,该方法依赖于现代处理器中提供的 SIMD 扩展的利用,结合了其他单处理器优化技术。与最常用的重建算法(即 WBP 和 SIRT)相比,该方法成功地生成了具有重要处理时间减少的全分辨率断层扫描图像。主要优势源于这样一个事实,即该方法可以在标准计算机上运行,而无需专门的硬件,这便于程序的开发、使用和管理。处理器设计的未来趋势为处理器的 SIMD 扩展在 3D 电子显微镜领域的向量处理开辟了极好的机会。

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