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用于测试光学表面和透镜的数字波前测量干涉仪。

Digital wavefront measuring interferometer for testing optical surfaces and lenses.

作者信息

Bruning J H, Herriott D R, Gallagher J E, Rosenfeld D P, White A D, Brangaccio D J

出版信息

Appl Opt. 1974 Nov 1;13(11):2693-703. doi: 10.1364/AO.13.002693.

DOI:10.1364/AO.13.002693
PMID:20134757
Abstract

A self-scanned 1024 element photodiode array and minicomputer are used to measure the phase (wavefront) in the interference pattern of an interferometer to lambda/100. The photodiode array samples intensities over a 32 x 32 matrix in the interference pattern as the length of the reference arm is varied piezoelectrically. Using these data the minicomputer synchronously detects the phase at each of the 1024 points by a Fourier series method and displays the wavefront in contour and perspective plot on a storage oscilloscope in less than 1 min (Bruning et al. Paper WE16, OSA Annual Meeting, Oct. 1972). The array of intensities is sampled and averaged many times in a random fashion so that the effects of air turbulence, vibrations, and thermal drifts are minimized. Very significant is the fact that wavefront errors in the interferometer are easily determined and may be automatically subtracted from current or subsequent wavefrots. Various programs supporting the measurement system include software for determining the aperture boundary, sum and difference of wavefronts, removal or insertion of tilt and focus errors, and routines for spatial manipulation of wavefronts. FFT programs transform wavefront data into point spread function and modulus and phase of the optical transfer function of lenses. Display programs plot these functions in contour and perspective. The system has been designed to optimize the collection of data to give higher than usual accuracy in measuring the individual elements and final performance of assembled diffraction limited optical systems, and furthermore, the short loop time of a few minutes makes the system an attractive alternative to constraints imposed by test glasses in the optical shop.

摘要

一个自扫描的1024元件光电二极管阵列和小型计算机用于测量干涉仪干涉图样中的相位(波前),精度达到λ/100。当参考臂的长度通过压电方式变化时,光电二极管阵列对干涉图样中一个32×32矩阵上的强度进行采样。利用这些数据,小型计算机通过傅里叶级数方法同步检测1024个点中每一点的相位,并在不到1分钟的时间内在存储示波器上以等高线和透视图的形式显示波前(布鲁宁等人,论文WE16,美国光学学会年会,1972年10月)。强度阵列以随机方式进行多次采样和平均,以便将空气湍流、振动和热漂移的影响降至最低。非常重要的一点是,干涉仪中的波前误差很容易确定,并且可以从当前或后续的波前中自动减去。支持测量系统的各种程序包括用于确定孔径边界、波前的和与差、消除或插入倾斜和聚焦误差的软件,以及用于波前空间操作的例程。快速傅里叶变换(FFT)程序将波前数据转换为点扩散函数以及透镜光学传递函数的模量和相位。显示程序以等高线和透视图的形式绘制这些函数。该系统的设计旨在优化数据采集,以便在测量组装的衍射受限光学系统的各个元件和最终性能时获得高于平常的精度,此外,几分钟的短循环时间使该系统成为光学车间中测试镜片所带来限制的一个有吸引力的替代方案。

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